Saturday, December 09, 2006
Logic analyser modules aid DDR3 development
Agilent Technologies and FuturePlus Systems Corp have announced a collaborative analysis solution for DDR3 memory buses operating at datarates up to 1066Mtransfer/s.
Agilent Technologies and FuturePlus Systems Corp have announced a collaborative analysis solution for DDR3 memory buses operating at datarates up to 1066Mtransfer/s. The new tool combines the FuturePlus FS2350 DDR3 interposer analysis probe and the Agilent 16950B series logic analyser modules, both introduced in November 2006. The new tools will be used by design teams in the computer, communications, semiconductor, aerospace and defence industries.
Those designers face growing bus-analysis challenges as ever-faster memory speeds continue to outpace existing measurement platforms.
The FuturePlus FS2350 analysis probe, designed for use with Agilent logic analysis systems, provides state analysis and protocol decode at up to 1066Mtransfer/s, as well as timing analysis at up to 4GHz in systems with typical data valid windows as narrow as 650ps.
The FS2350 is the only DDR3 interposer analysis probe proven to provide reliable 1066Mtransfer/s data capture.
The new Agilent 16950B 68-channel logic analyser modules provide high sample rate and deep memory offering state analysis capture of up to 667MHz and maximum datarate of 1066Mbit/s as well as up to 64Mword of acquisition memory.
The 16950B offers the performance necessary to validate leading-edge designs in the computer and semiconductor industries, such as DDR3 and front-side bus designs.
Agilent's new 16951B 68-channel logic analyser module offers the same acquisition performance as the 16950B, but also quadruples the industry's maximum memory depth to 256Msample.
Both of the new modules are designed for use in Agilent 16900 Series logic-analysis systems.
The FuturePlus Systems FS2350 analysis probe and Agilent 16950 Series logic analyser modules are available at the following prices: FS2350 DDR3 1066 memory analysis probe US $40,000; 16950B 68 channel logic analyser starting at US $23,500; and 16951B 68 channel logic analyser with 256Msample memory starting at US $65,000.
Agilent Technologies and FuturePlus Systems Corp have announced a collaborative analysis solution for DDR3 memory buses operating at datarates up to 1066Mtransfer/s. The new tool combines the FuturePlus FS2350 DDR3 interposer analysis probe and the Agilent 16950B series logic analyser modules, both introduced in November 2006. The new tools will be used by design teams in the computer, communications, semiconductor, aerospace and defence industries.
Those designers face growing bus-analysis challenges as ever-faster memory speeds continue to outpace existing measurement platforms.
The FuturePlus FS2350 analysis probe, designed for use with Agilent logic analysis systems, provides state analysis and protocol decode at up to 1066Mtransfer/s, as well as timing analysis at up to 4GHz in systems with typical data valid windows as narrow as 650ps.
The FS2350 is the only DDR3 interposer analysis probe proven to provide reliable 1066Mtransfer/s data capture.
The new Agilent 16950B 68-channel logic analyser modules provide high sample rate and deep memory offering state analysis capture of up to 667MHz and maximum datarate of 1066Mbit/s as well as up to 64Mword of acquisition memory.
The 16950B offers the performance necessary to validate leading-edge designs in the computer and semiconductor industries, such as DDR3 and front-side bus designs.
Agilent's new 16951B 68-channel logic analyser module offers the same acquisition performance as the 16950B, but also quadruples the industry's maximum memory depth to 256Msample.
Both of the new modules are designed for use in Agilent 16900 Series logic-analysis systems.
The FuturePlus Systems FS2350 analysis probe and Agilent 16950 Series logic analyser modules are available at the following prices: FS2350 DDR3 1066 memory analysis probe US $40,000; 16950B 68 channel logic analyser starting at US $23,500; and 16951B 68 channel logic analyser with 256Msample memory starting at US $65,000.
# posted by Swathi @ 1:43 AM
Mini OTDR aids installation and maintenance
The Yokogawa AQ7270 fiberXplorer is a mini OTDR claimed to set new standards in terms of performance, speed of operation and ease of use.
Available now in the UK from DMOptics, the Yokogawa AQ7270 fiberXplorer is a mini OTDR (optical time-domain reflectometer) claimed to set new standards in terms of performance, speed of operation, and ease of use to aid the installation and maintenance of core, metro and access networks including FTTH (fibre to the home) and PON (passive optical networks). The AQ7270 offers the industry's best performance in terms of event separation capability and the shortest dead zone - less than 80cm - to enable multiple-event detection even when events are close to one another. Its high-speed operation optimises work efficiency, while automatic test functions enable installation operatives to execute tests easily and reliably.
The Yokogawa AQ7270 is a compact, lightweight instrument measuring only 287 x 182 x 75mm and weighing 2.9kg.
It features a large (8.4in) high-luminance LCD display with a dark background which makes it easy to read the screen and manipulate markers, even in bright sunlight.
The Yokogawa AQ7270 Series includes eleven models, each of which will test up to four wavelengths covering the requirements of core, metro and access networks.
Seven wavelengths: 850, 1300, 1310, 1490, 1550, 1625 and 1650nm - are currently available in the product lineup.
Key features which improve operational efficiency are the instrument's speed of operation and its powerful integrated test functions.
Fast power-up enables users to start testing within 10 seconds on turning the OTDR on, while one-button testing is used to execute preset test routines for dramatically improving the productivity of operatives without specialist technical skills.
The Yokogawa AQ7270 is equipped with a number of functions to help users to execute a reliable measurement easily, including a fully automatic mode which sets appropriate test conditions according to the fibre under test, carries out the measurement, and saves the data to a file.
In addition, a 'fibre in use' indicator and alarm prevents on-channel measurements being made on fibres with in-service wavelengths.
Other features include multiple languages for menus, internal data storage of up to 1000 traces) and external USB storage.
A number of options are available to expand the instrument's test capability and work efficiency, including an optical power monitor, light source, built-in printer and built-in dummy fibre to aid near-end evaluation.
Available now in the UK from DMOptics, the Yokogawa AQ7270 fiberXplorer is a mini OTDR (optical time-domain reflectometer) claimed to set new standards in terms of performance, speed of operation, and ease of use to aid the installation and maintenance of core, metro and access networks including FTTH (fibre to the home) and PON (passive optical networks). The AQ7270 offers the industry's best performance in terms of event separation capability and the shortest dead zone - less than 80cm - to enable multiple-event detection even when events are close to one another. Its high-speed operation optimises work efficiency, while automatic test functions enable installation operatives to execute tests easily and reliably.
The Yokogawa AQ7270 is a compact, lightweight instrument measuring only 287 x 182 x 75mm and weighing 2.9kg.
It features a large (8.4in) high-luminance LCD display with a dark background which makes it easy to read the screen and manipulate markers, even in bright sunlight.
The Yokogawa AQ7270 Series includes eleven models, each of which will test up to four wavelengths covering the requirements of core, metro and access networks.
Seven wavelengths: 850, 1300, 1310, 1490, 1550, 1625 and 1650nm - are currently available in the product lineup.
Key features which improve operational efficiency are the instrument's speed of operation and its powerful integrated test functions.
Fast power-up enables users to start testing within 10 seconds on turning the OTDR on, while one-button testing is used to execute preset test routines for dramatically improving the productivity of operatives without specialist technical skills.
The Yokogawa AQ7270 is equipped with a number of functions to help users to execute a reliable measurement easily, including a fully automatic mode which sets appropriate test conditions according to the fibre under test, carries out the measurement, and saves the data to a file.
In addition, a 'fibre in use' indicator and alarm prevents on-channel measurements being made on fibres with in-service wavelengths.
Other features include multiple languages for menus, internal data storage of up to 1000 traces) and external USB storage.
A number of options are available to expand the instrument's test capability and work efficiency, including an optical power monitor, light source, built-in printer and built-in dummy fibre to aid near-end evaluation.
# posted by Swathi @ 1:42 AM
Friday, December 08, 2006
Novel SoC drives generator performance
The Tektronix AFG3000 Series of arbitrary/function generators consists of six models with the market-leading 240MHz, dual-channel, 2Gsample/s AFG3252 at the head of the series.
Now available from TTi (Thurlby Thandar Instruments) is the Tektronix AFG3000 Series of arbitrary/function generators, consisting of six models with the market-leading 240MHz, dual-channel, 2Gsample/s AFG3252 at the head of the series. Thanks to an innovative architecture based on a powerful 'generator on a chip' (GoC) ASIC, the AFG3000 Series delivers industry-leading performance in its class. At the same time, the platform's user interface is straightforward and easy to use, maximising productivity.
The AFG3000 Series spans a broad range of applications.
The 240MHz models at the top of the series will appeal to designers developing high-performance computing or communications equipment and video products.
The high 2Gsample/s sampling rate and wide analogue bandwidth provide a minimum rise time of less than 2.5ns.
Both rise and fall times can be independently adjusted on single or dual channels up to a maximum of 62.5s.
The AFG3000 supports 12 standard functions (waveform shapes), including sinusoidal waves at frequencies up to 240MHz.
A built-in arbitrary waveform generator capable of delivering sample rates up to 2Gsample/s (an industry first in this class of signal sources) and 14bit amplitude resolution can generate or replicate any waveform.
This exceptional performance is essential for maintaining narrow test margins, and it protects the user's investment as bandwidth requirements increase over time.
All the instruments in the series are equipped with a stable time base whose drift is only +/-1ppm per year.
The dual-channel models provide completely independent selection of waveform and frequency for each channel.
Designers working with mixed-signal devices, for example, will be able to drive the device with both analogue and digital signals simultaneously, at two distinct frequencies if necessary.
Similarly, two serial bit streams - one ideal and the other impaired, can be fed to a component at the same time.
By using the phase align and phase adjust features, the dual-channel versions are also ideal for generating I and Q channels for testing of communications equipment components.
The large (5.6in) LCD on every AFG3000 Series model is easy to read at a glance, offering ample space for both graphical waveforms and instrument settings.
This display supports an information-rich user interface that is patterned after the proven graphical interface used in Tektronix oscilloscopes.
Simple on-screen menus are supplemented by shortcut keys that control the most common waveform parameters.
AFG3000 Series users can move quickly around the front panel to set up even the most complex modulated signals.
The 0.18um ASIC at the heart of the AFG3000 Series instruments integrates a host of essential features into a single CMOS chip encompassing the core signal-generating functions.
The GoC incorporates a direct digital synthesis (DDS) circuit, a digital-to-analogue convertor, and other signal-generating elements including a pulse generator with variable period and independently adjustable rise and fall times, a modulation source, a noise source, and a frequency sweep generator.
The ASIC also includes up to 128Ksample of arbitrary waveform memory.
Standard function generator waveforms are stored in separate memory.
The GoC design enables better performance and lower cost than has been previously available in this class of instrument.
USB, GPIB and LAN interfaces are provided, with an additional front panel USB connector for waveform storage on a memory device.
Now available from TTi (Thurlby Thandar Instruments) is the Tektronix AFG3000 Series of arbitrary/function generators, consisting of six models with the market-leading 240MHz, dual-channel, 2Gsample/s AFG3252 at the head of the series. Thanks to an innovative architecture based on a powerful 'generator on a chip' (GoC) ASIC, the AFG3000 Series delivers industry-leading performance in its class. At the same time, the platform's user interface is straightforward and easy to use, maximising productivity.
The AFG3000 Series spans a broad range of applications.
The 240MHz models at the top of the series will appeal to designers developing high-performance computing or communications equipment and video products.
The high 2Gsample/s sampling rate and wide analogue bandwidth provide a minimum rise time of less than 2.5ns.
Both rise and fall times can be independently adjusted on single or dual channels up to a maximum of 62.5s.
The AFG3000 supports 12 standard functions (waveform shapes), including sinusoidal waves at frequencies up to 240MHz.
A built-in arbitrary waveform generator capable of delivering sample rates up to 2Gsample/s (an industry first in this class of signal sources) and 14bit amplitude resolution can generate or replicate any waveform.
This exceptional performance is essential for maintaining narrow test margins, and it protects the user's investment as bandwidth requirements increase over time.
All the instruments in the series are equipped with a stable time base whose drift is only +/-1ppm per year.
The dual-channel models provide completely independent selection of waveform and frequency for each channel.
Designers working with mixed-signal devices, for example, will be able to drive the device with both analogue and digital signals simultaneously, at two distinct frequencies if necessary.
Similarly, two serial bit streams - one ideal and the other impaired, can be fed to a component at the same time.
By using the phase align and phase adjust features, the dual-channel versions are also ideal for generating I and Q channels for testing of communications equipment components.
The large (5.6in) LCD on every AFG3000 Series model is easy to read at a glance, offering ample space for both graphical waveforms and instrument settings.
This display supports an information-rich user interface that is patterned after the proven graphical interface used in Tektronix oscilloscopes.
Simple on-screen menus are supplemented by shortcut keys that control the most common waveform parameters.
AFG3000 Series users can move quickly around the front panel to set up even the most complex modulated signals.
The 0.18um ASIC at the heart of the AFG3000 Series instruments integrates a host of essential features into a single CMOS chip encompassing the core signal-generating functions.
The GoC incorporates a direct digital synthesis (DDS) circuit, a digital-to-analogue convertor, and other signal-generating elements including a pulse generator with variable period and independently adjustable rise and fall times, a modulation source, a noise source, and a frequency sweep generator.
The ASIC also includes up to 128Ksample of arbitrary waveform memory.
Standard function generator waveforms are stored in separate memory.
The GoC design enables better performance and lower cost than has been previously available in this class of instrument.
USB, GPIB and LAN interfaces are provided, with an additional front panel USB connector for waveform storage on a memory device.
# posted by Swathi @ 1:42 AM
TM-1000 on show at Buckingham Palace
Two of Hitachi's TM-1000 tabletop microscopes were on display as part of the Natural History Museum's contribution to a special science exhibition.
TM-1000 on show at Buckingham Palace Two of Hitachi's TM-1000 tabletop microscopes were on display as part of the Natural History Museum's contribution to a special science exhibition held at Buckingham Palace on 24 October 2006. More than 800 GCSE and A-level students and their teachers from across the country visited the Palace to watch a 'Punk Science' show and view an exhibition demonstrating areas of current scientific research. The event was designed to acknowledge the importance of British Science in national life.
On the same day, The Queen opened the Smith Centre at the Science Museum.
The TM-1000s were in use all day, and were chosen for their ease of use, ability to image a wide range of different materials without any special sample preparation and their excellent imaging quality.
Their ease of use allowed the teenagers to obtain images for themselves, with samples such as red blood cells, feathers, split ends from hair, wasps and bees being particularly popular since they could easily be related to the 'real world'.
Twenty different exhibits were organised with support from the Royal Society, the Royal Academy of Engineering, the Natural History Museum, the Science Museum, Research Councils UK and the Royal Commission for the Exhibition of 1851.
These included 'Mars in their eyes' 'How to Build a Human', 'Parasites and Lions in London', 'So you think you could design an aeroengine?!' and Superhuman Vision: Seeing with Terahertz'.
In the evening, the Queen and the Duke of Edinburgh hosted a reception for 500 members of the British scientific community including Professor Stephen Hawking and the microscopes were also on display for this.
TM-1000 on show at Buckingham Palace Two of Hitachi's TM-1000 tabletop microscopes were on display as part of the Natural History Museum's contribution to a special science exhibition held at Buckingham Palace on 24 October 2006. More than 800 GCSE and A-level students and their teachers from across the country visited the Palace to watch a 'Punk Science' show and view an exhibition demonstrating areas of current scientific research. The event was designed to acknowledge the importance of British Science in national life.
On the same day, The Queen opened the Smith Centre at the Science Museum.
The TM-1000s were in use all day, and were chosen for their ease of use, ability to image a wide range of different materials without any special sample preparation and their excellent imaging quality.
Their ease of use allowed the teenagers to obtain images for themselves, with samples such as red blood cells, feathers, split ends from hair, wasps and bees being particularly popular since they could easily be related to the 'real world'.
Twenty different exhibits were organised with support from the Royal Society, the Royal Academy of Engineering, the Natural History Museum, the Science Museum, Research Councils UK and the Royal Commission for the Exhibition of 1851.
These included 'Mars in their eyes' 'How to Build a Human', 'Parasites and Lions in London', 'So you think you could design an aeroengine?!' and Superhuman Vision: Seeing with Terahertz'.
In the evening, the Queen and the Duke of Edinburgh hosted a reception for 500 members of the British scientific community including Professor Stephen Hawking and the microscopes were also on display for this.
# posted by Swathi @ 1:41 AM
Thursday, December 07, 2006
Mini OTDR sets new performance standards
The new Yokogawa AQ7270 fibreXplorer is a mini OTDR which sets new standards in terms of performance, speed of operation, and ease of use.
Mini OTDR sets new performance standards The new Yokogawa AQ7270 fibreXplorer is a mini OTDR (optical time-domain reflectometer) which sets new standards in terms of performance, speed of operation, and ease of use to aid the installation and maintenance of core, metro and access networks including FTTH (fibre to the home) and PON (passive optical networks). The AQ7270 offers the industry's best performance in terms of event separation capability and the shortest dead zone - less than 80 cm - to enable multiple-event detection even when events are close to one another. Its high-speed operation optimises work efficiency, while automatic test functions enable installation operatives to execute tests easily and reliably.
'The worldwide spread of broadband services has stimulated the installation of optical fibre in metro and access networks, which in turn has increased the demand for portable and reliable test equipment to aid the installation and maintenance of these networks', comments Terry Marrinan, Sales and Marketing Director, Europe and Africa, of Yokogawa Europe's Test and Measurement Group: 'Our new mini OTDR has been developed to address these challenges with the particular aims of improving operability to boost work efficiency and cost-effectiveness.' The AQ7270 is a compact, lightweight instrument measuring only 287 x 182 x 75mm and weighing 2.9kg.
It features a large (8.4in) high-luminance LCD display with a dark background which makes it easy to read the screen and manipulate markers, even in bright sunlight.
The AQ7270 Series includes eleven models, each of which will test up to four wavelengths covering the requirements of core, metro and access networks.
Seven wavelengths: 850, 1300, 1310, 1490, 1550, 1625 and 1650 nm - are currently available in the product line-up.
Key features which improve operational efficiency are the instrument's speed of operation and its powerful integrated test functions.
Fast power-up enables users to start testing within 10 seconds on turning the OTDR on, while one-button testing is used to execute preset test routines for dramatically improving the productivity of operatives without specialist technical skills.
The AQ7270 is equipped with a number of functions to help users to execute a reliable measurement easily, including a fully automatic mode which sets appropriate test conditions according to the fibre under test, carries out the measurement, and saves the data to a file.
In addition, a 'fibre in use' indicator and alarm prevents on-channel measurements being made on fibres with in-service wavelengths.
Other features include multiple languages for menus, internal data storage of up to 1000 traces) and external USB storage.
A number of options are available to expand the instrument's test capability and work efficiency, including an optical power monitor, light source, built-in printer and built-in dummy fibre to aid near-end evaluation.
Mini OTDR sets new performance standards The new Yokogawa AQ7270 fibreXplorer is a mini OTDR (optical time-domain reflectometer) which sets new standards in terms of performance, speed of operation, and ease of use to aid the installation and maintenance of core, metro and access networks including FTTH (fibre to the home) and PON (passive optical networks). The AQ7270 offers the industry's best performance in terms of event separation capability and the shortest dead zone - less than 80 cm - to enable multiple-event detection even when events are close to one another. Its high-speed operation optimises work efficiency, while automatic test functions enable installation operatives to execute tests easily and reliably.
'The worldwide spread of broadband services has stimulated the installation of optical fibre in metro and access networks, which in turn has increased the demand for portable and reliable test equipment to aid the installation and maintenance of these networks', comments Terry Marrinan, Sales and Marketing Director, Europe and Africa, of Yokogawa Europe's Test and Measurement Group: 'Our new mini OTDR has been developed to address these challenges with the particular aims of improving operability to boost work efficiency and cost-effectiveness.' The AQ7270 is a compact, lightweight instrument measuring only 287 x 182 x 75mm and weighing 2.9kg.
It features a large (8.4in) high-luminance LCD display with a dark background which makes it easy to read the screen and manipulate markers, even in bright sunlight.
The AQ7270 Series includes eleven models, each of which will test up to four wavelengths covering the requirements of core, metro and access networks.
Seven wavelengths: 850, 1300, 1310, 1490, 1550, 1625 and 1650 nm - are currently available in the product line-up.
Key features which improve operational efficiency are the instrument's speed of operation and its powerful integrated test functions.
Fast power-up enables users to start testing within 10 seconds on turning the OTDR on, while one-button testing is used to execute preset test routines for dramatically improving the productivity of operatives without specialist technical skills.
The AQ7270 is equipped with a number of functions to help users to execute a reliable measurement easily, including a fully automatic mode which sets appropriate test conditions according to the fibre under test, carries out the measurement, and saves the data to a file.
In addition, a 'fibre in use' indicator and alarm prevents on-channel measurements being made on fibres with in-service wavelengths.
Other features include multiple languages for menus, internal data storage of up to 1000 traces) and external USB storage.
A number of options are available to expand the instrument's test capability and work efficiency, including an optical power monitor, light source, built-in printer and built-in dummy fibre to aid near-end evaluation.
# posted by Swathi @ 1:40 AM
Oscilloscopes for the German Federal Armed Forces
Agilent Technologies has won a European-wide bid to supply the German Federal Armed Forces with more than 1500 digital storage oscilloscopes (DSOs).
Digital storage oscilloscopes for the German Federal Armed Forces Agilent Technologies has won a European-wide bid to supply the German Federal Armed Forces with more than 1500 digital storage oscilloscopes (DSOs). The Agilent 6000 Series oscilloscopes will be used by engineers and technicians to test electrical equipment at the maintenance and repair facilities of the German air force, navy and army. Agilent will begin delivering the oscilloscopes before the end of the year.
Agilent created the 6000 Series oscilloscopes to meet the challenges that engineers and technicians face with testing sophisticated electronic designs.
Today's designs are no longer based only on analog technology, but increasingly contain digital signals and serial communication buses, creating an environment of mixed fast and slow signals.
This mixed-signal environment means engineers need to measure composite signal conditions and view time-correlated analog and digital signals.
Agilent's 6000 Series oscilloscopes give engineers these capabilities.
'Our new 6000 Series has made its mark on the oscilloscope market,' said Hans-Janduuml;rgen Bochtler, sales manager for Agilent's Electronic Measurement Group in Germany, Austria and Switzerland.
'Since introducing the new oscilloscope family last year, we have recorded significant growth and won market share in this highly competitive arena'.
The 6000 Series includes 19 different oscilloscope models with frequency ranges from 100 MHz to 1 GHz with two or four analog channels.
The series also includes mixed signal oscilloscopes (MSOs) that offer 16 digital channels integrated with the analog channels.
The 6000 Series oscilloscopes offer many technological innovations, such as a high-resolution display and fast signal processing speed, which simplify the task and shorten the time it takes to identify intermittent interference signals.
They also offer deep digital memory, multiple standard I/O interfaces (LAN/USB/GPIB), and progressive serial trigger possibilities for I2C/SPI/CAN/LIN buses.
With optional application packages, the oscilloscopes can decode the signals from these specialised buses and quickly make internal FPGA measurements.
In November 2006, Agilent added three models to the 6000 Series that are optimised for use in test systems.
Because of their LXI (LAN eXtensions for Instrumentation) interfaces and compact form-factor (only 44 mm high), these models are especially suitable for installing in test racks.
Digital storage oscilloscopes for the German Federal Armed Forces Agilent Technologies has won a European-wide bid to supply the German Federal Armed Forces with more than 1500 digital storage oscilloscopes (DSOs). The Agilent 6000 Series oscilloscopes will be used by engineers and technicians to test electrical equipment at the maintenance and repair facilities of the German air force, navy and army. Agilent will begin delivering the oscilloscopes before the end of the year.
Agilent created the 6000 Series oscilloscopes to meet the challenges that engineers and technicians face with testing sophisticated electronic designs.
Today's designs are no longer based only on analog technology, but increasingly contain digital signals and serial communication buses, creating an environment of mixed fast and slow signals.
This mixed-signal environment means engineers need to measure composite signal conditions and view time-correlated analog and digital signals.
Agilent's 6000 Series oscilloscopes give engineers these capabilities.
'Our new 6000 Series has made its mark on the oscilloscope market,' said Hans-Janduuml;rgen Bochtler, sales manager for Agilent's Electronic Measurement Group in Germany, Austria and Switzerland.
'Since introducing the new oscilloscope family last year, we have recorded significant growth and won market share in this highly competitive arena'.
The 6000 Series includes 19 different oscilloscope models with frequency ranges from 100 MHz to 1 GHz with two or four analog channels.
The series also includes mixed signal oscilloscopes (MSOs) that offer 16 digital channels integrated with the analog channels.
The 6000 Series oscilloscopes offer many technological innovations, such as a high-resolution display and fast signal processing speed, which simplify the task and shorten the time it takes to identify intermittent interference signals.
They also offer deep digital memory, multiple standard I/O interfaces (LAN/USB/GPIB), and progressive serial trigger possibilities for I2C/SPI/CAN/LIN buses.
With optional application packages, the oscilloscopes can decode the signals from these specialised buses and quickly make internal FPGA measurements.
In November 2006, Agilent added three models to the 6000 Series that are optimised for use in test systems.
Because of their LXI (LAN eXtensions for Instrumentation) interfaces and compact form-factor (only 44 mm high), these models are especially suitable for installing in test racks.
# posted by Swathi @ 1:39 AM
Wednesday, December 06, 2006
Reliability test alliance
Agilent Technologies has announced a formal agreement with Core Wafer Systems (CWS) for the semiconductor test market space.
Agilent Technologies has announced a formal agreement with Core Wafer Systems (CWS), a leading provider of accelerated and long-term reliability test solutions and analysis tools for the semiconductor test market space. The Advanced Scaleable Unified Reliability (ASUR) suite of solutions from CWS exclusively uses Agilent's system tester and instruments for the Single Device Reliability (SDR) and multi-site Parallel Device Reliability (PDR) test products. ASUR includes fifth-generation PDQ-WLR, the accelerated reliability standard in the test industry offered by Agilent since 1994.
Complementing the testing methodology is the Reliability Data Analyser (RDA) software from CWS for real-time, post-test analysis and lifetime prediction for devices, metallisation and dielectrics.
As part of the agreement, Agilent offers CWS software reliability solutions, services and test structure libraries, which are uniquely compatible with Agilent hardware.
Agilent will sell a turnkey solution and support the integrated software and hardware as a single source vendor for reliability customers.
'CWS' software reliability test solutions are a natural extension to the reliability solutions already supported by the Agilent B1500A semiconductor device analyser and the Agilent 4070 series of parametric testers,' said Minoru Ebihara, vice president and general manager of Agilent Hachioji Semiconductor Test Division.
'Now we can offer a complete range of semiconductor reliability test solutions, from instruments to systems, and the modular nature of our approach makes it easy and cost-effective for our customers to start small and add later to their reliability test capabilities as their needs change'.
'We are pleased to continue and expand our partnership with such an established and well-respected leader in the industry,' said Roger Goetz, CEO, Core Wafer Systems.
'This alliance with Agilent will allow us to further expand our reach to the worldwide customer base'.
'Now all customers will have convenient access to these advanced tools, which will help them increase efficiency and lower their overall cost-of-test at the deep nanometer scale'.
Core Wafer Systems (CWS) specialises in single-site and multi-site (parallel) accelerated and long-term reliability testing and analysis, and provides modular wafer-level and package-level solutions for current and emerging technologies.
Agilent Technologies has announced a formal agreement with Core Wafer Systems (CWS), a leading provider of accelerated and long-term reliability test solutions and analysis tools for the semiconductor test market space. The Advanced Scaleable Unified Reliability (ASUR) suite of solutions from CWS exclusively uses Agilent's system tester and instruments for the Single Device Reliability (SDR) and multi-site Parallel Device Reliability (PDR) test products. ASUR includes fifth-generation PDQ-WLR, the accelerated reliability standard in the test industry offered by Agilent since 1994.
Complementing the testing methodology is the Reliability Data Analyser (RDA) software from CWS for real-time, post-test analysis and lifetime prediction for devices, metallisation and dielectrics.
As part of the agreement, Agilent offers CWS software reliability solutions, services and test structure libraries, which are uniquely compatible with Agilent hardware.
Agilent will sell a turnkey solution and support the integrated software and hardware as a single source vendor for reliability customers.
'CWS' software reliability test solutions are a natural extension to the reliability solutions already supported by the Agilent B1500A semiconductor device analyser and the Agilent 4070 series of parametric testers,' said Minoru Ebihara, vice president and general manager of Agilent Hachioji Semiconductor Test Division.
'Now we can offer a complete range of semiconductor reliability test solutions, from instruments to systems, and the modular nature of our approach makes it easy and cost-effective for our customers to start small and add later to their reliability test capabilities as their needs change'.
'We are pleased to continue and expand our partnership with such an established and well-respected leader in the industry,' said Roger Goetz, CEO, Core Wafer Systems.
'This alliance with Agilent will allow us to further expand our reach to the worldwide customer base'.
'Now all customers will have convenient access to these advanced tools, which will help them increase efficiency and lower their overall cost-of-test at the deep nanometer scale'.
Core Wafer Systems (CWS) specialises in single-site and multi-site (parallel) accelerated and long-term reliability testing and analysis, and provides modular wafer-level and package-level solutions for current and emerging technologies.
# posted by Swathi @ 1:38 AM
Analyser optimised for serial-data-based designs
Agilent Technologies announces an oscilloscope measurement system with specialised tools for designing, debugging and validating designs that include high-data-rate serial buses.
Digital signal analyser optimised for serial-data-based designs Agilent Technologies announces an oscilloscope measurement system with specialised tools for designing, debugging and validating designs that include high-data-rate serial buses. The new Agilent DSA80000B digital signal analyser (DSA) system offers the industry's lowest noise floor, jitter-measurement floor and trigger jitter, and the flattest frequency response, making it possible for engineers to gather more accurate data about the low-voltage differential signals in their designs. The DSA80000B DSA is ideal for engineers working in the communications, data storage, computer, aerospace/defence and consumer electronics industries.
Agilent's DSA80000B DSA is built around an Infiniium DSO80000B Series oscilloscope and the InfiniiMax probing system, which provide critical capabilities for achieving accurate and repeatable measurements.
The oscilloscope and probe capabilities are augmented with high-speed serial data analysis and EZJIT Plus jitter-analysis software to give designers additional capabilities for designing, debugging and validating their serial-data-based designs.
The high-speed serial data analysis software provides designers with a fast and easy way to pinpoint signal integrity problems and validate performance for serial interface designs.
It allows designers to perform mask testing, characterize serial data streams that employ embedded clocks, and decode 8b/10b data from serial data streams.
The software also enables designers to verify compliance to computer, communications and data-communications standards such as PCI Express, Serial ATA (SATA), serial attached SCSI (SAS), Fibre Channel (FC), XAUI and Gigabit Ethernet.
With the faster edge speeds and shrinking data-valid windows in today's high-speed digital designs, insight into the causes of signal jitter is critical for ensuring the reliability of designs.
The EZJIT Plus jitter-analysis software helps designers identify and quantify jitter components.
Time correlation of jitter to the real-time signal makes it easy to trace jitter components to their sources.
The DSA80000B DSA's superior signal integrity capabilities come from Agilent's RF design experience, proprietary packaging technologies and CMOS ADC architecture.
Superior signal integrity helps engineers maximise design margins because they do not waste measurement accuracy due to poor noise, jitter or frequency response of the oscilloscope or probing system.
Digital signal analyser optimised for serial-data-based designs Agilent Technologies announces an oscilloscope measurement system with specialised tools for designing, debugging and validating designs that include high-data-rate serial buses. The new Agilent DSA80000B digital signal analyser (DSA) system offers the industry's lowest noise floor, jitter-measurement floor and trigger jitter, and the flattest frequency response, making it possible for engineers to gather more accurate data about the low-voltage differential signals in their designs. The DSA80000B DSA is ideal for engineers working in the communications, data storage, computer, aerospace/defence and consumer electronics industries.
Agilent's DSA80000B DSA is built around an Infiniium DSO80000B Series oscilloscope and the InfiniiMax probing system, which provide critical capabilities for achieving accurate and repeatable measurements.
The oscilloscope and probe capabilities are augmented with high-speed serial data analysis and EZJIT Plus jitter-analysis software to give designers additional capabilities for designing, debugging and validating their serial-data-based designs.
The high-speed serial data analysis software provides designers with a fast and easy way to pinpoint signal integrity problems and validate performance for serial interface designs.
It allows designers to perform mask testing, characterize serial data streams that employ embedded clocks, and decode 8b/10b data from serial data streams.
The software also enables designers to verify compliance to computer, communications and data-communications standards such as PCI Express, Serial ATA (SATA), serial attached SCSI (SAS), Fibre Channel (FC), XAUI and Gigabit Ethernet.
With the faster edge speeds and shrinking data-valid windows in today's high-speed digital designs, insight into the causes of signal jitter is critical for ensuring the reliability of designs.
The EZJIT Plus jitter-analysis software helps designers identify and quantify jitter components.
Time correlation of jitter to the real-time signal makes it easy to trace jitter components to their sources.
The DSA80000B DSA's superior signal integrity capabilities come from Agilent's RF design experience, proprietary packaging technologies and CMOS ADC architecture.
Superior signal integrity helps engineers maximise design margins because they do not waste measurement accuracy due to poor noise, jitter or frequency response of the oscilloscope or probing system.
# posted by Swathi @ 1:37 AM
Tuesday, December 05, 2006
New capability for spectrum analysers
Agilent Technologies has introduced a new Time Division - Synchronous Code Division Multiple Access (TD-SCDMA) measurement capability for its PSA Series high-performance spectrum analysers.
Agilent Technologies has introduced a new Time Division - Synchronous Code Division Multiple Access (TD-SCDMA) measurement capability for its PSA Series high-performance spectrum analysers - the industry's first and only test and measurement solution for analysis of HSDPA/8PSK signals over TD-SCDMA. This measurement capability enables RandD engineers to quickly and efficiently troubleshoot and analyse complex time-varying TD-SCDMA signals, thereby significantly speeding time to market. TD-SCDMA is the official 3G mobile telecommunications standard in the People's Republic of China.
It combines TDMA and spread-spectrum CDMA technologies.
Agilent's new measurement capability for TD-SCDMA is comprised of two different measurement personalities.
Option 212, TD-SCDMA Modulation Analysis, troubleshoots and measures the quality of TD-SCDMA modulated signals, while Option 213, HSDPA/8PSK Modulation Analysis, troubleshoots and measures HSDPA/8PSK channels over TD-SCDMA.
Featuring pass/fail indicators, these measurement personalities allow the engineer to quickly verify conformance to the TD-SCDMA standard.
'As a true leader and innovator in test and measurement solutions for new and emerging communication standards, Agilent is fully committed to supporting the TD-SCDMA market in China,' said Guy Sene, vice president and general manager of Agilent's Signal Analysis Division.
'That commitment is demonstrated today as we become the first and only supplier to provide analysis of HSDPA/8PSK signals over TD-SCDMA.
This capability will enable today's RandD engineers to stay on the leading edge of wireless standards, while quickly moving forward to TD-SCDMA deployment'.
The Agilent PSA Series spectrum analszer offers high-performance spectrum analysis up to 50 GHz with a leading-edge combination of analysis bandwidth, flexibility, speed, accuracy, and dynamic range.
These capabilities, coupled with the PSA Series' powerful one-button measurements, make it an innovative and comprehensive solution for RandD and manufacturing engineers in cellular and emerging wireless communications, aerospace and defence.
Agilent Technologies has introduced a new Time Division - Synchronous Code Division Multiple Access (TD-SCDMA) measurement capability for its PSA Series high-performance spectrum analysers - the industry's first and only test and measurement solution for analysis of HSDPA/8PSK signals over TD-SCDMA. This measurement capability enables RandD engineers to quickly and efficiently troubleshoot and analyse complex time-varying TD-SCDMA signals, thereby significantly speeding time to market. TD-SCDMA is the official 3G mobile telecommunications standard in the People's Republic of China.
It combines TDMA and spread-spectrum CDMA technologies.
Agilent's new measurement capability for TD-SCDMA is comprised of two different measurement personalities.
Option 212, TD-SCDMA Modulation Analysis, troubleshoots and measures the quality of TD-SCDMA modulated signals, while Option 213, HSDPA/8PSK Modulation Analysis, troubleshoots and measures HSDPA/8PSK channels over TD-SCDMA.
Featuring pass/fail indicators, these measurement personalities allow the engineer to quickly verify conformance to the TD-SCDMA standard.
'As a true leader and innovator in test and measurement solutions for new and emerging communication standards, Agilent is fully committed to supporting the TD-SCDMA market in China,' said Guy Sene, vice president and general manager of Agilent's Signal Analysis Division.
'That commitment is demonstrated today as we become the first and only supplier to provide analysis of HSDPA/8PSK signals over TD-SCDMA.
This capability will enable today's RandD engineers to stay on the leading edge of wireless standards, while quickly moving forward to TD-SCDMA deployment'.
The Agilent PSA Series spectrum analszer offers high-performance spectrum analysis up to 50 GHz with a leading-edge combination of analysis bandwidth, flexibility, speed, accuracy, and dynamic range.
These capabilities, coupled with the PSA Series' powerful one-button measurements, make it an innovative and comprehensive solution for RandD and manufacturing engineers in cellular and emerging wireless communications, aerospace and defence.
# posted by Swathi @ 1:36 AM
Draft-802.11n MIMO test solution
Agilent Technologies has announced an innovative test solution in support of the draft-802.11n specification.
Draft-802.11n MIMO test solution Agilent Technologies has announced an innovative test solution in support of the draft-802.11n specification. The 802.11n standard adds Multiple-Input Multiple-Output (MIMO) to increase data throughput and increase range. The accuracy, fast measurement speed and reliability of Agilent's new test solution make it the ideal choice for manufacturing managers and engineers performing high-volume test on draft-802.11n devices or modules.
Agilent's solution consists of the N4011A MIMO/Multi-Port Adapter and the N4010A Wireless Connectivity Test Set, configured with Option 103 for WLAN Tx/Rx analysis and Option 108 for 802.11n MIMO modulation analysis.
A MIMO upgrade kit is available for customers who currently own the N4010A test set.
The N4011A connects to the N4010A test set to provide four switchable RF I/O ports for testing devices of all WLAN formats, including draft-802.11n.
The N4010A Option 108 and N4011A combination provides fast electronic switching to allow capture and analysis of WLAN bursts on multiple channels without compromising measurement accuracy.
This innovative technique allows full demodulation of the MIMO signal, providing greater insight to failure mechanisms revealed by measurements such as channel isolation and single-channel or MIMO EVM.
'In high-volume manufacturing environments, the speed of the N4010A/N4011A provides increased throughput, while its measurement accuracy and repeatability provide users with confidence in the quality of the test device,' said Earl Thompson, vice president and general manager of Agilent's Wireless Division.
'This level of performance is critical to ensuring the lower cost of test that today's manufacturing managers and engineers demand'.
'In the process, it helps them improve their overall competitiveness as well as profitability'.
Agilent's draft-802.11n MIMO test solution also provides an interface to connect the device-under-test to a golden radio.
This 19-inch rack-width setup enables calibrated multi-channel receiver tests and uplink/downlink throughput testing.
When coupled with N4010A's parametric tests, these capabilities provide a comprehensive test functionality which ensures product quality.
The Agilent N4010A Wireless Connectivity Test Set is flexible enough to measure the latest emerging wireless standards.
As a versatile multi-format wireless connectivity test solution, it can be configured to meet the needs of today's Bluetooth, Bluetooth EDR, WLAN 802.11a,b,g and n and ZigBee applications.
Draft-802.11n MIMO test solution Agilent Technologies has announced an innovative test solution in support of the draft-802.11n specification. The 802.11n standard adds Multiple-Input Multiple-Output (MIMO) to increase data throughput and increase range. The accuracy, fast measurement speed and reliability of Agilent's new test solution make it the ideal choice for manufacturing managers and engineers performing high-volume test on draft-802.11n devices or modules.
Agilent's solution consists of the N4011A MIMO/Multi-Port Adapter and the N4010A Wireless Connectivity Test Set, configured with Option 103 for WLAN Tx/Rx analysis and Option 108 for 802.11n MIMO modulation analysis.
A MIMO upgrade kit is available for customers who currently own the N4010A test set.
The N4011A connects to the N4010A test set to provide four switchable RF I/O ports for testing devices of all WLAN formats, including draft-802.11n.
The N4010A Option 108 and N4011A combination provides fast electronic switching to allow capture and analysis of WLAN bursts on multiple channels without compromising measurement accuracy.
This innovative technique allows full demodulation of the MIMO signal, providing greater insight to failure mechanisms revealed by measurements such as channel isolation and single-channel or MIMO EVM.
'In high-volume manufacturing environments, the speed of the N4010A/N4011A provides increased throughput, while its measurement accuracy and repeatability provide users with confidence in the quality of the test device,' said Earl Thompson, vice president and general manager of Agilent's Wireless Division.
'This level of performance is critical to ensuring the lower cost of test that today's manufacturing managers and engineers demand'.
'In the process, it helps them improve their overall competitiveness as well as profitability'.
Agilent's draft-802.11n MIMO test solution also provides an interface to connect the device-under-test to a golden radio.
This 19-inch rack-width setup enables calibrated multi-channel receiver tests and uplink/downlink throughput testing.
When coupled with N4010A's parametric tests, these capabilities provide a comprehensive test functionality which ensures product quality.
The Agilent N4010A Wireless Connectivity Test Set is flexible enough to measure the latest emerging wireless standards.
As a versatile multi-format wireless connectivity test solution, it can be configured to meet the needs of today's Bluetooth, Bluetooth EDR, WLAN 802.11a,b,g and n and ZigBee applications.
# posted by Swathi @ 1:35 AM
Monday, December 04, 2006
Current thinking on testing protective earthing
Jim Wallace, research and technology manager at Seaward Electronic, looks at the merits of using 25A and 200mA currents to test protective earthing conductors in electrical and electronic appliances.
Jim Wallace, research and technology manager at Seaward Electronic, looks at the merits of using 25A and 200mA currents to test protective earthing conductors in electrical and electronic appliances. Debate in the appliance industry on the most appropriate test current for checking the integrity of the protective earthing conductor has been around for many years. Historically a higher test current of 25A has often been favoured on the premise that it will best detect any damaged conductors present.
In addition, when analogue instruments were widely used for low resistance measurement, it was often necessary to use high test currents to produce sufficient voltage drop across the sample to generate the necessary needle deflection.
With modern electronics this is no longer necessary and more recently, given the growth in popularity of portable hand held test instruments, others have come to prefer a lower test current of 200mA as a means of eliminating any risk of damage to the equipment under test.
In reality, the different test currents both have their merits and the IEE Code of Practice for In-service Testing and Inspection of Electrical Equipment recommends both 25A and 200mA.
However, for routine testing and testing after repair of appliances and testing of fixed installations, the majority of European standards now specify a test current of 200mA.
Protective earthing conductors are designed to prevent electric shock by allowing the passage of electric current under fault conditions.
In Class I electrical equipment the protective earthing conductor resistance needs to be of sufficiently low value to prevent the voltage on external metal parts rising to a level where the shock potential presents a hazard to life.
A variety of national and international standards define a maximum acceptable level of resistance of a protective earthing conductor.
These standards not only specify the maximum resistance values but also define the test current, the open circuit voltage and the duration of that test.
With any item of electrical equipment it is likely that the protective earthing conductor will comprise various lengths of flexible cable linking the equipment to the point of electrical supply.
It is also possible that various types of switching mechanism may exist including relays and electrical switches.
Any measurement of a protective earthing conductor will therefore encounter both bulk and contact forms of electrical resistance.
Both these types of resistance can have implications on the use of different test methods with varying currents, voltages and time durations.
Bulk resistance is the material along the conductors' path.
This will tend to be constant although it will be affected by temperature and in certain cases by physical pressure.
Contact resistance, however, is a variable resistance that occurs at the interface between two conducting surfaces.
Contact resistance is made up of constriction resistance and film resistance and will be dependent on the contact force between the two surfaces in contact.
Careful inspection of the contact interface between two conducting materials will show that surfaces that may appear flat and uniform to the naked eye will invariably comprise a series of rough peaks and valleys when viewed under a microscope.
In reality, the two mating surfaces will therefore only make contact with each other where the surface peaks (asperites) meet and the actual surface area of this real contact area is typically much smaller than may be apparent.
In these circumstances constriction resistance occurs as the electrical current is channelled through small point contacts that occur at these peak points or interfaces.
Layers of oxide and dirt that are formed on the material's surface also create film resistance.
These oxides have higher resistance than the conducting material on either side of the junction.
The impact of these different types of resistance can therefore have significant impact on the results obtained from varying levels of test current.
It follows, therefore that irrespective of the test current, contact resistance between the test probe and the appliance under test can give a variation in measurement performance.
It is therefore important to ensure a secure connection to the equipment under test.
The perceived benefit of the relatively high 25A test current is that it will be capable of overcoming the implications of film resistance.
However, and conversely, excessively high levels of test current will cause temperature rise throughout the protective earthing conductor path.
If applied long enough will have a significant impact on the resistance value measures.
In the event of a damaged protective earthing conductor, where several strands are broken, a high current test may also detect the damage by 'fusing' the cable.
Fusing occurs due to the heating effect of the test current - the current flows, generating heat and the wire melts apart resulting in an open circuit.
The fusing action is produced by a temperature rise in the cable and it therefore takes a finite time for the cable to fuse.
The temperature rise and hence the ability to fuse a damaged cable depends upon the test current and the test duration.
In protective fuses this is referred to as the I2t rating.
The higher the current or the longer the test duration the higher the probability of fusing the damaged cable.
The probability of the test fusing a cable with broken strands will therefore depend on: a) how many strands are broken b) the magnitude of the test current c) the duration of the test The purpose of the earth continuity test is to ensure that accessible conductive parts, which rely upon protective earthing as a means of protection against electric shock, are connected to the protective earth of the supply.
There may also be accessible conductive parts which are protected through other means such as double insulation or protective impedance but which are connected to protective earth for functional reasons such as signal screening.
These earth paths may not be designed to carry high currents and passing a high test current through them may therefore result in damage to the equipment under test.
A 200mA test current is rapidly becoming the European standard for in-service testing and testing after repair.
In particular, those test instruments that comply with the requirements of EN61557-4 are capable of making accurate resistance measurements using a 200mA test current.
The use of a lower test current such as 200mA also reduces or eliminates the risk of damage to the EUT caused by passing high test currents through paths to ground that are not intended to provide protective earthing.
One of the reasons often provided for the use of a higher test current is that the resistance values being measured are in the order of 0.1 ohms and, in principle, a higher test current will aid the measurement process.
However, this particular argument loses some of its merits with the development of modern test technology that enables very accurate resistance measurements to be made using low test currents.
This work has been pioneered by Seaward Electronic in the form of a new-patented high intensity pulse or spike test that overcomes the previous contact resistance problems that inhibited the wider application of protective earth testing using 1A or 200mA test currents.
As a result the new concept successfully conquers variations in measurement that can be caused by weak contact resistance between the test probe and the appliance under test, for example, when measuring continuity of tarnished or corroded parts such as a kettle element or in detachable IEC power cables.
Importantly, the unique low current test technology introduced by Seaward enables valid earth continuity tests to be carried out using battery powered testers, significantly increasing the portability and versatility of hand held testers and speeding up the testing process.
This new test feature is now incorporated across all instruments in the company's new PrimeTest range of hand held portable appliance testers.
In summary, both 25A and 200mA are recommended internationally as a valid test current for the in-service inspection of electrical equipment and both are of value to electricians and test engineers.
However, a high test current doesn't necessarily detect a damaged PE path and does not always give better accuracy.
In addition, modern electronic technology means that low current testing can now be applied more effectively than may have been the case in the past.
Whatever the test current, contact resistance is an ever present variable.
However, a short duration high current spike prior to a 200mA test can overcome such problems.
Jim Wallace, research and technology manager at Seaward Electronic, looks at the merits of using 25A and 200mA currents to test protective earthing conductors in electrical and electronic appliances. Debate in the appliance industry on the most appropriate test current for checking the integrity of the protective earthing conductor has been around for many years. Historically a higher test current of 25A has often been favoured on the premise that it will best detect any damaged conductors present.
In addition, when analogue instruments were widely used for low resistance measurement, it was often necessary to use high test currents to produce sufficient voltage drop across the sample to generate the necessary needle deflection.
With modern electronics this is no longer necessary and more recently, given the growth in popularity of portable hand held test instruments, others have come to prefer a lower test current of 200mA as a means of eliminating any risk of damage to the equipment under test.
In reality, the different test currents both have their merits and the IEE Code of Practice for In-service Testing and Inspection of Electrical Equipment recommends both 25A and 200mA.
However, for routine testing and testing after repair of appliances and testing of fixed installations, the majority of European standards now specify a test current of 200mA.
Protective earthing conductors are designed to prevent electric shock by allowing the passage of electric current under fault conditions.
In Class I electrical equipment the protective earthing conductor resistance needs to be of sufficiently low value to prevent the voltage on external metal parts rising to a level where the shock potential presents a hazard to life.
A variety of national and international standards define a maximum acceptable level of resistance of a protective earthing conductor.
These standards not only specify the maximum resistance values but also define the test current, the open circuit voltage and the duration of that test.
With any item of electrical equipment it is likely that the protective earthing conductor will comprise various lengths of flexible cable linking the equipment to the point of electrical supply.
It is also possible that various types of switching mechanism may exist including relays and electrical switches.
Any measurement of a protective earthing conductor will therefore encounter both bulk and contact forms of electrical resistance.
Both these types of resistance can have implications on the use of different test methods with varying currents, voltages and time durations.
Bulk resistance is the material along the conductors' path.
This will tend to be constant although it will be affected by temperature and in certain cases by physical pressure.
Contact resistance, however, is a variable resistance that occurs at the interface between two conducting surfaces.
Contact resistance is made up of constriction resistance and film resistance and will be dependent on the contact force between the two surfaces in contact.
Careful inspection of the contact interface between two conducting materials will show that surfaces that may appear flat and uniform to the naked eye will invariably comprise a series of rough peaks and valleys when viewed under a microscope.
In reality, the two mating surfaces will therefore only make contact with each other where the surface peaks (asperites) meet and the actual surface area of this real contact area is typically much smaller than may be apparent.
In these circumstances constriction resistance occurs as the electrical current is channelled through small point contacts that occur at these peak points or interfaces.
Layers of oxide and dirt that are formed on the material's surface also create film resistance.
These oxides have higher resistance than the conducting material on either side of the junction.
The impact of these different types of resistance can therefore have significant impact on the results obtained from varying levels of test current.
It follows, therefore that irrespective of the test current, contact resistance between the test probe and the appliance under test can give a variation in measurement performance.
It is therefore important to ensure a secure connection to the equipment under test.
The perceived benefit of the relatively high 25A test current is that it will be capable of overcoming the implications of film resistance.
However, and conversely, excessively high levels of test current will cause temperature rise throughout the protective earthing conductor path.
If applied long enough will have a significant impact on the resistance value measures.
In the event of a damaged protective earthing conductor, where several strands are broken, a high current test may also detect the damage by 'fusing' the cable.
Fusing occurs due to the heating effect of the test current - the current flows, generating heat and the wire melts apart resulting in an open circuit.
The fusing action is produced by a temperature rise in the cable and it therefore takes a finite time for the cable to fuse.
The temperature rise and hence the ability to fuse a damaged cable depends upon the test current and the test duration.
In protective fuses this is referred to as the I2t rating.
The higher the current or the longer the test duration the higher the probability of fusing the damaged cable.
The probability of the test fusing a cable with broken strands will therefore depend on: a) how many strands are broken b) the magnitude of the test current c) the duration of the test The purpose of the earth continuity test is to ensure that accessible conductive parts, which rely upon protective earthing as a means of protection against electric shock, are connected to the protective earth of the supply.
There may also be accessible conductive parts which are protected through other means such as double insulation or protective impedance but which are connected to protective earth for functional reasons such as signal screening.
These earth paths may not be designed to carry high currents and passing a high test current through them may therefore result in damage to the equipment under test.
A 200mA test current is rapidly becoming the European standard for in-service testing and testing after repair.
In particular, those test instruments that comply with the requirements of EN61557-4 are capable of making accurate resistance measurements using a 200mA test current.
The use of a lower test current such as 200mA also reduces or eliminates the risk of damage to the EUT caused by passing high test currents through paths to ground that are not intended to provide protective earthing.
One of the reasons often provided for the use of a higher test current is that the resistance values being measured are in the order of 0.1 ohms and, in principle, a higher test current will aid the measurement process.
However, this particular argument loses some of its merits with the development of modern test technology that enables very accurate resistance measurements to be made using low test currents.
This work has been pioneered by Seaward Electronic in the form of a new-patented high intensity pulse or spike test that overcomes the previous contact resistance problems that inhibited the wider application of protective earth testing using 1A or 200mA test currents.
As a result the new concept successfully conquers variations in measurement that can be caused by weak contact resistance between the test probe and the appliance under test, for example, when measuring continuity of tarnished or corroded parts such as a kettle element or in detachable IEC power cables.
Importantly, the unique low current test technology introduced by Seaward enables valid earth continuity tests to be carried out using battery powered testers, significantly increasing the portability and versatility of hand held testers and speeding up the testing process.
This new test feature is now incorporated across all instruments in the company's new PrimeTest range of hand held portable appliance testers.
In summary, both 25A and 200mA are recommended internationally as a valid test current for the in-service inspection of electrical equipment and both are of value to electricians and test engineers.
However, a high test current doesn't necessarily detect a damaged PE path and does not always give better accuracy.
In addition, modern electronic technology means that low current testing can now be applied more effectively than may have been the case in the past.
Whatever the test current, contact resistance is an ever present variable.
However, a short duration high current spike prior to a 200mA test can overcome such problems.
# posted by Swathi @ 1:34 AM
Entry level portable appliance safety checker
The latest addition to the Seaward Primetest range of safety testing instruments for electronic and electrical appliances is a hand held portable appliance checker.
The latest addition to the Seaward Primetest range of safety testing instruments for electronic and electrical appliances is a hand held portable appliance checker. The new Primetest 50 is an easy to use basic electrical safety checker that provides an immediate 'pass/fail' indication at the push of a button for electrical appliances and equipment. The lightweight instrument is battery powered for maximum portability and incorporates clear, easy to follow operating instructions.
As well as essential earth continuity and insulation resistance tests, the checker incorporates an IEC lead test and a power socket test.
This introductory level instrument is designed for use for those with little or no electrical testing experience including maintenance staff in commercial premises, schools, colleges, care homes and the leisure industry.
The Primetest 50 is also available as part of an optional PATSolutions package that links the instrument with appropriate test accessories and test data recording software in keeping with the specific requirements of individual users.
For example, the Primetest 50 can be used with the new PDA-based PATGuard Workabout software for mobile data input that allows test results on different electrical appliances to be recorded immediately for subsequent print out or storage.
The Primetest range from Seaward incorporates a range of electrical safety testing instruments, each with different technical capabilities and test functions for use by all involved in ensuring the safety of electrical equipment used in the workplace.
The latest addition to the Seaward Primetest range of safety testing instruments for electronic and electrical appliances is a hand held portable appliance checker. The new Primetest 50 is an easy to use basic electrical safety checker that provides an immediate 'pass/fail' indication at the push of a button for electrical appliances and equipment. The lightweight instrument is battery powered for maximum portability and incorporates clear, easy to follow operating instructions.
As well as essential earth continuity and insulation resistance tests, the checker incorporates an IEC lead test and a power socket test.
This introductory level instrument is designed for use for those with little or no electrical testing experience including maintenance staff in commercial premises, schools, colleges, care homes and the leisure industry.
The Primetest 50 is also available as part of an optional PATSolutions package that links the instrument with appropriate test accessories and test data recording software in keeping with the specific requirements of individual users.
For example, the Primetest 50 can be used with the new PDA-based PATGuard Workabout software for mobile data input that allows test results on different electrical appliances to be recorded immediately for subsequent print out or storage.
The Primetest range from Seaward incorporates a range of electrical safety testing instruments, each with different technical capabilities and test functions for use by all involved in ensuring the safety of electrical equipment used in the workplace.
# posted by Swathi @ 1:33 AM
Sunday, December 03, 2006
Handheld solution for eye pattern analysis
Anritsu introduces the Bit Master MP1026A Eye Pattern Analyser, the first handheld solution for conducting physical layer (PHY) eye pattern measurements on the high speed interfaces.
Anritsu introduces the Bit Master MP1026A Eye Pattern Analyser, the first handheld solution for conducting physical layer (PHY) eye pattern measurements on the high speed interfaces at OC-192/STM-64, 10G Fibre Channel, and 10G Ethernet data rates. With two electrical channel inputs of 25 GHz bandwidth each, Bit Master offers eye pattern, pulse pattern, and mask compliance measurements for rates from 0.1 to 12.5 Gbps in a handheld, rugged, and battery-powered instrument. At nearly half the price of a benchtop sampling oscilloscope, Bit Master is a cost-effective alternative for conducting eye pattern analysis.
Bit Master also performs accurate statistical jitter measurements, which are now being used everyday by engineers to fine-tune, verify, and troubleshoot transmitter performance, especially the outputs of SFP/XFP modules.
These analysis tools are especially insightful because they inform engineers on the cause of eye closure that lead to bit error rate problems in the overall network.
A key element to Bit Master's attractive price point is its compact size.
At 12' x 8' x 3' (314 x 211 x 78 mm), Bit Master occupies very little bench space.
It is also lightweight, weighing only 9 lbs (4 kg) including battery, so Bit Master can be easily transported to conduct measurements anytime, anywhere.
Bit Master packs outstanding performance despite the compact size.
It has low jitter of 1 ps rms and low electrical noise of 1 mV rms, typically.
With a sampling rate up to 100 ksamples/sec, Bit Master is a powerful instrument for eye pattern, pulse pattern, and mask compliance testing.
Bit Master is manufacturing-ready to verify whether transmitters are meeting industry standards with integrated compliance mask testing features and user-defined histogram windows.
Whether users choose from standard compliance masks or user-defined masks, the simple setups and keystrokes ensure repeatable measurements and increases operator productivity with easy-to-interpret pass/fail indicators.
For SFP/XFP modules with optical interfaces, Bit Master can be configured with optional internal clock recovery unit (option 2) and external O/E module (option 3) for compliance testing.
The external O/E module supports wavelengths between 750 and 1650 nm and contains the requisite 4th order Bessel-Thomson filter (BTF) response required by the testing standards for 10G Ethernet.
Bit Master provides outstanding value, whether operating in RandD, manufacturing, or field environments.
It has 256 MB compact flash, Ethernet, and USB2.0 connectivity to archive setups, update firmware, and transfer results using Anritsu's free PC-based Master Software Tools.
Remote programming of repetitive tasks is also possible via the Ethernet connection.
Bit Master is ergonomically designed with whisper-quiet operation and 8.4 in (21.3 cm) diagonal TFT colour display.
Bit Master also comes with a standard one-year warranty covering both parts and labour.
Anritsu introduces the Bit Master MP1026A Eye Pattern Analyser, the first handheld solution for conducting physical layer (PHY) eye pattern measurements on the high speed interfaces at OC-192/STM-64, 10G Fibre Channel, and 10G Ethernet data rates. With two electrical channel inputs of 25 GHz bandwidth each, Bit Master offers eye pattern, pulse pattern, and mask compliance measurements for rates from 0.1 to 12.5 Gbps in a handheld, rugged, and battery-powered instrument. At nearly half the price of a benchtop sampling oscilloscope, Bit Master is a cost-effective alternative for conducting eye pattern analysis.
Bit Master also performs accurate statistical jitter measurements, which are now being used everyday by engineers to fine-tune, verify, and troubleshoot transmitter performance, especially the outputs of SFP/XFP modules.
These analysis tools are especially insightful because they inform engineers on the cause of eye closure that lead to bit error rate problems in the overall network.
A key element to Bit Master's attractive price point is its compact size.
At 12' x 8' x 3' (314 x 211 x 78 mm), Bit Master occupies very little bench space.
It is also lightweight, weighing only 9 lbs (4 kg) including battery, so Bit Master can be easily transported to conduct measurements anytime, anywhere.
Bit Master packs outstanding performance despite the compact size.
It has low jitter of 1 ps rms and low electrical noise of 1 mV rms, typically.
With a sampling rate up to 100 ksamples/sec, Bit Master is a powerful instrument for eye pattern, pulse pattern, and mask compliance testing.
Bit Master is manufacturing-ready to verify whether transmitters are meeting industry standards with integrated compliance mask testing features and user-defined histogram windows.
Whether users choose from standard compliance masks or user-defined masks, the simple setups and keystrokes ensure repeatable measurements and increases operator productivity with easy-to-interpret pass/fail indicators.
For SFP/XFP modules with optical interfaces, Bit Master can be configured with optional internal clock recovery unit (option 2) and external O/E module (option 3) for compliance testing.
The external O/E module supports wavelengths between 750 and 1650 nm and contains the requisite 4th order Bessel-Thomson filter (BTF) response required by the testing standards for 10G Ethernet.
Bit Master provides outstanding value, whether operating in RandD, manufacturing, or field environments.
It has 256 MB compact flash, Ethernet, and USB2.0 connectivity to archive setups, update firmware, and transfer results using Anritsu's free PC-based Master Software Tools.
Remote programming of repetitive tasks is also possible via the Ethernet connection.
Bit Master is ergonomically designed with whisper-quiet operation and 8.4 in (21.3 cm) diagonal TFT colour display.
Bit Master also comes with a standard one-year warranty covering both parts and labour.
# posted by Swathi @ 1:32 AM
Probe addresses signal measurement requirements
Tektronix has announced the introduction of the P7313SMA differential probe.
Tektronix has announced the introduction of the P7313SMA differential probe. With 13 GHz bandwidth and an extended termination voltage range, the new SMA probe is ideal for serial bus validation and compliance testing of the latest high-speed standards including HDMI 1.3 that promises consumers the highest-quality home theatre experience, and PCI-Express 2.0 that promises new levels of performance and scalability in computing devices. Many of today's high speed serial data standards employ differential signalling.
The need for efficient solutions that can speed up the process for serial compliance and validation has led to the development of SMA differential probing solutions.
SMA probes provide the capability for customers to connect to two SMA connectors on their device under test and bring those two signals into a differential probe that converts the two complementary signals into one single-ended signal.
The P7313SMA probe is designed for measuring differential signals in a 50?
signalling environment, providing the ability to convert from a differential SMA signal path to a single oscilloscope input channel.
This enables high performance differential measurements on every oscilloscope channel, providing greater insight into how a serial bus design is operating.
'The Tektronix P7313SMA differential probe provides the ability to measure a high-speed differential signal on each channel of a multiple channel oscilloscope such as the DSA70804,' said Mike Fitzgerald, General Manager, Measurement Accessories Product Line, Tektronix.
'Unlike competing alternatives in the market, the P7313SMA probe has an extended termination voltage range that makes it ideal for testing differential standards with high common mode voltages like HDMI.
The P7313SMA provides engineers working with the latest high-speed serial standards a world class differential acquisition system'.
The P7313SMA provides a common mode DC voltage input to the termination network.
The termination voltage can be supplied either externally by the user or internally by the oscilloscope.
There is also an automatic mode that senses the common mode voltage of the input signal and automatically sets the termination voltage to match.
In addition to the extended termination voltage range, the P7313SMA offers industry-leading return loss, a critical specification that is very important in compliance testing as frequencies increase.
An extended dynamic range allows the probe to measure larger signals while in the 2.5x low noise attenuation setting.
Tektronix has announced the introduction of the P7313SMA differential probe. With 13 GHz bandwidth and an extended termination voltage range, the new SMA probe is ideal for serial bus validation and compliance testing of the latest high-speed standards including HDMI 1.3 that promises consumers the highest-quality home theatre experience, and PCI-Express 2.0 that promises new levels of performance and scalability in computing devices. Many of today's high speed serial data standards employ differential signalling.
The need for efficient solutions that can speed up the process for serial compliance and validation has led to the development of SMA differential probing solutions.
SMA probes provide the capability for customers to connect to two SMA connectors on their device under test and bring those two signals into a differential probe that converts the two complementary signals into one single-ended signal.
The P7313SMA probe is designed for measuring differential signals in a 50?
signalling environment, providing the ability to convert from a differential SMA signal path to a single oscilloscope input channel.
This enables high performance differential measurements on every oscilloscope channel, providing greater insight into how a serial bus design is operating.
'The Tektronix P7313SMA differential probe provides the ability to measure a high-speed differential signal on each channel of a multiple channel oscilloscope such as the DSA70804,' said Mike Fitzgerald, General Manager, Measurement Accessories Product Line, Tektronix.
'Unlike competing alternatives in the market, the P7313SMA probe has an extended termination voltage range that makes it ideal for testing differential standards with high common mode voltages like HDMI.
The P7313SMA provides engineers working with the latest high-speed serial standards a world class differential acquisition system'.
The P7313SMA provides a common mode DC voltage input to the termination network.
The termination voltage can be supplied either externally by the user or internally by the oscilloscope.
There is also an automatic mode that senses the common mode voltage of the input signal and automatically sets the termination voltage to match.
In addition to the extended termination voltage range, the P7313SMA offers industry-leading return loss, a critical specification that is very important in compliance testing as frequencies increase.
An extended dynamic range allows the probe to measure larger signals while in the 2.5x low noise attenuation setting.
# posted by Swathi @ 1:31 AM
