Wednesday, February 14, 2007
Digital Serial Analysers test high-speed data
The DSA70000 real-time Digital Serial Analysers (DSA) and P7500 probes from Tektronix test the next generation of high-speed serial data applications such as PCI-Express 2.0, HDMI 1.3, and SATA III.
Tektronix has brought out a new line of DSA70000 real-time Digital Serial Analysers (DSA) and P7500 probes, both providing high-speed performance for the next generation of fast serial data applications such as PCI-Express 2.0, HDMI 1.3, and SATA III. The latest serial technologies are faster and more complex than prior generations and require better test equipment capable of greater performance and more extensive analysis. 'Tektronix is intimate with the latest technologies that underpin the fast data buses inside PCs, entertainment systems, networks, new wireless standards, and with on-demand delivery of digital video over converged multi-carrier networks that are integral to the new digital world', said Rick Wills, Chairman and CEO, Tektronix.
'With our latest announcements, customers have access to the most advanced instruments and software available for testing their high-speed serial data designs'.
The new real-time DSA70000 Series with bandwidth to 20GHz are said to be the world's fastest 4-channel real-time oscilloscopes, and the P7500 Series are claimed to be the world's fastest active differential probes.
'2nd and 3rd generation serial data technologies provide order of magnitude greater data throughput than possible only a few years ago and now underpin the fastest product designs', said Martyn Etherington, Vice President, Instruments Business, Tektronix.
'With the new DSA70000 Series real-time oscilloscopes, DSA8200 sampling oscilloscopes, AWG7000 arbitrary waveform generators, and P7500 series probes, engineers have access to an entirely new portfolio with the capabilities needed to develop next generation products incorporating high-speed serial data technologies''.
The DSA7000 Analysers have up to 20GHz bandwidth on all four channels simultaneously, 50 Gsample/s on all four channels, up to 200Mbyte memory on all four channels, and more than 300,000 waveforms captured per second to provide both critical insight into signal behaviour and in-depth analysis.
The new models include 12.5GHz, 16GHz, and 20GHz versions.
The DSA70000 series instruments include leading Serial Compliance, Jitter and Timing Analysis tools that provide patented software clock recovery, RT-Eye Serial Compliance and Analysis Software, and a full battery of standard-specific parametric measurements.
The new DSA70000 can be optioned with the industry's broadest range of automated software applications to speed pass/fail testing to industry standards such as PCI Express, SATA, FB-DIMM, HDMI and more.
Tektronix has brought out a new line of DSA70000 real-time Digital Serial Analysers (DSA) and P7500 probes, both providing high-speed performance for the next generation of fast serial data applications such as PCI-Express 2.0, HDMI 1.3, and SATA III. The latest serial technologies are faster and more complex than prior generations and require better test equipment capable of greater performance and more extensive analysis. 'Tektronix is intimate with the latest technologies that underpin the fast data buses inside PCs, entertainment systems, networks, new wireless standards, and with on-demand delivery of digital video over converged multi-carrier networks that are integral to the new digital world', said Rick Wills, Chairman and CEO, Tektronix.
'With our latest announcements, customers have access to the most advanced instruments and software available for testing their high-speed serial data designs'.
The new real-time DSA70000 Series with bandwidth to 20GHz are said to be the world's fastest 4-channel real-time oscilloscopes, and the P7500 Series are claimed to be the world's fastest active differential probes.
'2nd and 3rd generation serial data technologies provide order of magnitude greater data throughput than possible only a few years ago and now underpin the fastest product designs', said Martyn Etherington, Vice President, Instruments Business, Tektronix.
'With the new DSA70000 Series real-time oscilloscopes, DSA8200 sampling oscilloscopes, AWG7000 arbitrary waveform generators, and P7500 series probes, engineers have access to an entirely new portfolio with the capabilities needed to develop next generation products incorporating high-speed serial data technologies''.
The DSA7000 Analysers have up to 20GHz bandwidth on all four channels simultaneously, 50 Gsample/s on all four channels, up to 200Mbyte memory on all four channels, and more than 300,000 waveforms captured per second to provide both critical insight into signal behaviour and in-depth analysis.
The new models include 12.5GHz, 16GHz, and 20GHz versions.
The DSA70000 series instruments include leading Serial Compliance, Jitter and Timing Analysis tools that provide patented software clock recovery, RT-Eye Serial Compliance and Analysis Software, and a full battery of standard-specific parametric measurements.
The new DSA70000 can be optioned with the industry's broadest range of automated software applications to speed pass/fail testing to industry standards such as PCI Express, SATA, FB-DIMM, HDMI and more.
# posted by Swathi @ 9:26 PM
Inspection system for computerised tomography
The X-Tek Group will announce a new camera and detector combination for the Revolution NanoTech X-ray inspection system at APEX 2007.
The X-Tek Group, one of the world's leading manufacturers of real-time microfocus X-ray systems, will announce a new camera and detector combination for the Revolution NanoTech X-ray inspection system and a new validation station for enhanced production capability at APEX, Booth 2237. Visitors to the X-Tek booth will also be able to experience a demonstration of computerised tomography (CT), a powerful new 3D imaging capability to the industry leading Revolution system. Impix, the new scientific grade camera and detector combination, further improves the dynamic range, accuracy, repeatability and feature recognition capability of the Revolution.
The camera boasts real-time frame rates at full camera resolution and full dynamic range.
Using the X-Tek InspectX image enhancement software the X-ray image is displayed on a separate LCD monitor for clutter free viewing.
The Revolution provides over 65 thousand levels of grey to assist in distinguishing fine features in components.
Supplied with X-Tek's On Chip Integration feature, the Revolution is also capable of imaging very transparent materials at very low X-ray energies.
The Impix camera will also enhance the CT option on the Revolution by further improving the voxel resolution capability.
The validation station option allows viewing/reviewing of captured data offline, enabling continued use of the X-ray system for production.
Data can be accessed remotely by serial number or by barcode scanning.
X-Tek's CT capability has recently received extensive global recognition.
X-Tek pioneered a powerful new X-ray source which allowed an international team of researchers to reveal the true purpose of one of the most technically advanced artefacts from the Greek classical world, the Antikythera mechanism.
X-Tek specifically developed a new 450kV microfocus X-ray source for the project, a dramatic advancement over the conventional 225kV source.
The results from X-Tek's new CT system provided researchers with new material and enabled them to read inscriptions that had never been seen before.
CT produces high resolution 3D data sets which can be viewed at any angle, sliced in any direction and measured to enable detailed analysis of the internal structure of a wide range of components and objects.
X-Tek has made true 3D imaging available, affordable and simple to use for fast internal analysis, measurement, reverse engineering and product verification.
The Revolution features submicron defect detection, 75 degree oblique viewing, digital detectors and automatic BGA software.
Offering the highest degree of off axis tilt available and NanoTech open tube technology for unparalleled resolution and magnification, visitors are invited to bring a sample with them to the X-Tek booth to test the system's capability.
The Revolution offers maximum magnification (up to 6000x) at all angles over the entire 410 x 410mm manipulator scan area, for 100% BGA, micro-BGA, multilayer board and PCB solder joint inspection, with quick analysis of BGA ball wetting, attachment, cracks and delaminations.
The X-Tek Group, one of the world's leading manufacturers of real-time microfocus X-ray systems, will announce a new camera and detector combination for the Revolution NanoTech X-ray inspection system and a new validation station for enhanced production capability at APEX, Booth 2237. Visitors to the X-Tek booth will also be able to experience a demonstration of computerised tomography (CT), a powerful new 3D imaging capability to the industry leading Revolution system. Impix, the new scientific grade camera and detector combination, further improves the dynamic range, accuracy, repeatability and feature recognition capability of the Revolution.
The camera boasts real-time frame rates at full camera resolution and full dynamic range.
Using the X-Tek InspectX image enhancement software the X-ray image is displayed on a separate LCD monitor for clutter free viewing.
The Revolution provides over 65 thousand levels of grey to assist in distinguishing fine features in components.
Supplied with X-Tek's On Chip Integration feature, the Revolution is also capable of imaging very transparent materials at very low X-ray energies.
The Impix camera will also enhance the CT option on the Revolution by further improving the voxel resolution capability.
The validation station option allows viewing/reviewing of captured data offline, enabling continued use of the X-ray system for production.
Data can be accessed remotely by serial number or by barcode scanning.
X-Tek's CT capability has recently received extensive global recognition.
X-Tek pioneered a powerful new X-ray source which allowed an international team of researchers to reveal the true purpose of one of the most technically advanced artefacts from the Greek classical world, the Antikythera mechanism.
X-Tek specifically developed a new 450kV microfocus X-ray source for the project, a dramatic advancement over the conventional 225kV source.
The results from X-Tek's new CT system provided researchers with new material and enabled them to read inscriptions that had never been seen before.
CT produces high resolution 3D data sets which can be viewed at any angle, sliced in any direction and measured to enable detailed analysis of the internal structure of a wide range of components and objects.
X-Tek has made true 3D imaging available, affordable and simple to use for fast internal analysis, measurement, reverse engineering and product verification.
The Revolution features submicron defect detection, 75 degree oblique viewing, digital detectors and automatic BGA software.
Offering the highest degree of off axis tilt available and NanoTech open tube technology for unparalleled resolution and magnification, visitors are invited to bring a sample with them to the X-Tek booth to test the system's capability.
The Revolution offers maximum magnification (up to 6000x) at all angles over the entire 410 x 410mm manipulator scan area, for 100% BGA, micro-BGA, multilayer board and PCB solder joint inspection, with quick analysis of BGA ball wetting, attachment, cracks and delaminations.
# posted by Swathi @ 9:25 PM
Clamp-on meters are easy to handle
Fully functional clamp meters with simplified interfaces and easy-to-read, oversized display screens help technicians get their work done quickly and easily.
Amprobe Test Tools introduces the ACDC-100 and ACDC-100 TRMS digital clamp-ons, fully functional clamp meters with simplified interfaces and easy-to-read, oversized display screens to help technicians get their work done quickly and easily. Both models feature auto and manual ranging, relative zero mode, max capture for inrush current measurements (30ms response), auto power off, data hold, diode test, audible continuity and 'third hand' test probe holder. The ACDC-100 TRMS features true RMS measurements and a backlit display.
The clamp-ons are safety rated CAT III 600 V.
The ergonomics of the ACDC100 are enhanced by Amprobe's Red, Rubber, Ribs design, making it easy to handle.
The rubber overmoulded case includes built-in probe storage.
The ACDC-100 and ACDC-100 TRMS come with carrying cases, test leads, two AAA batteries and user manual.
Amprobe Test Tools introduces the ACDC-100 and ACDC-100 TRMS digital clamp-ons, fully functional clamp meters with simplified interfaces and easy-to-read, oversized display screens to help technicians get their work done quickly and easily. Both models feature auto and manual ranging, relative zero mode, max capture for inrush current measurements (30ms response), auto power off, data hold, diode test, audible continuity and 'third hand' test probe holder. The ACDC-100 TRMS features true RMS measurements and a backlit display.
The clamp-ons are safety rated CAT III 600 V.
The ergonomics of the ACDC100 are enhanced by Amprobe's Red, Rubber, Ribs design, making it easy to handle.
The rubber overmoulded case includes built-in probe storage.
The ACDC-100 and ACDC-100 TRMS come with carrying cases, test leads, two AAA batteries and user manual.
# posted by Swathi @ 9:25 PM
Oscilloscopes are digital serial analysers
Tektronix has announced the introduction of the industry's first ultra-high-performance oscilloscope with 20GHz real-time bandwidth and 50Gsample/s simultaneous sampling rate.
Tektronix has announced the introduction of the industry's first ultra-high-performance oscilloscope with 20GHz real-time bandwidth and 50Gsample/s simultaneous sampling rate. The DSA70000 digital serial analyser (DSA) oscilloscope family includes several new models - 20GHz DSA72004, 16GHz DSA71604 and 12.5GHz DSA71254. These new products provide unmatched performance and analysis and extend the real-time DPO performance platform introduced last summer with 4-8GHz DSA models.
The DSA70000 series offers more four-channel performance than any alternative oscilloscopes and are ideal for the high-speed serial data applications of today and tomorrow.
The new Tektronix oscilloscopes are an integral part of the new high-speed serial data test bench, and will foster development of next generation products for the new digital world.
New generations of consumer, computing, communications, and video products and systems are emerging that use faster, wider information buses and interconnects - often using serial data architectures - within the underlying semiconductors and IC components.
Ultra-high-performance oscilloscopes are required to capture the frequency harmonics of high-speed serial signals to make accurate and repeatable measurements.
The DSA71000 and DSA72000 oscilloscopes provide support on all channels for ultra-high bandwidth, deep memory, fast sample rate, and fast waveform capture rate.
This is especially valuable for high speed multi-lane serial data architectures where multichannel analysis is needed for lane skew timing violations.
The models are ideal for design engineers developing and testing state-of-the-art serial data applications, including PCI-Express 2, SATA 3, FB-DIMM II, HDMI 1.3, and 10Gbit/s Ethernet.
'The need for high-end test equipment continues to escalate in keeping with market demands driving greater performance', said Colin Shepard, Vice President, Performance Oscilloscopes, Tektronix.
'Engineers need an oscilloscope that is free of compromises, that has leading specifications to keep pace with the performance curve, and that provides a complete, efficient and productive test solution'.
'The new DSA70000 models are the best real-time oscilloscopes yet developed, delivering the performance our customers need for high-speed multi-lane serial data applications and processor buses'.
'The new oscilloscopes provide the most extensive analysis and compliance measurements available and reinforce the Tektronix track record of innovation with the right technologies at the right time for the market'.
The new digital real-time (DRT) models provide the best combination of performance with 12.5, 16, and 20GHz version, 50Gsample/s maximum sample rate per channel, and up to 200Msample memory across all four channels.
A FastAcq acquisition mode waveform capture rate greater than 300,000 per second - about 1000 times faster than any competing alternative - with the DPX parallel architecture signal processor yields both critical insight into signal behaviour and in-depth analysis.
The unequaled combination of DRT and DPO ultrahigh performance on four channels simultaneously provides engineers with the industry-leading attributes they need for the most demanding test challenges.
Faster than any other, the new real-time oscilloscopes share a new generation scalable performance platform first introduced less than a year ago that makes broad use of IBM 7HP silicon germanium (SiGe) technology.
The 7HP SiGe technology offers peak performance for applications requiring high speed transfer of data, low noise, high linearity and low power consumption.
'The new DSA70000 oscilloscopes are the ultra-high performance products that Tektronix envisioned when work began several years ago with IBM on a 7HP silicon germanium implementation', said David Harame, Director of Enablement and IBM Fellow, Systems and Technology Group, IBM.
'The results of the collaboration are a test and measurement platform for the future, apparent in these transformational products'.
'The new DSA70000 products provide industry leading multi-channel performance, a requirement for design engineers developing next generation products'.
This level of performance is necessary for emerging 2nd and 3rd generation serial data technologies.
At 50Gsample/s and 200M record length, an engineer can capture more than 4 ms of data, ensuring the best resolution at full performance compared with alternative products.
The 20GHz DSA72004 provides 3rd harmonic measurements for datarates up to 12Gbit/s and 5th harmonic measurements on signals running up to 8Gbit/s.
This performance satisfies the signal integrity measurement and compliance requirements of the fastest chip-to-chip serial bus architectures.
With the DSA70000, Tektronix provides the performance and functionality most needed by design and test engineers working with high-speed serial databuses including the best multilayer analysis tools for the debug and validation of single and multilane signals.
The DSA70000 series instruments include leading Serial Compliance, Jitter and Timing Analysis tools that provide patented software clock recovery, RT-Eye Serial Compliance and Analysis Software, and a full battery of standard-specific parametric measurements.
The DSA70000 also includes hardware serial pattern triggering up to 3.125Gbit/s.
Engineers can add options for domain expertise that provide specific Pass/Fail waveform mask and measurement limit testing in conformance with industry-acknowledged standards.
The DSA70000 models can be optioned with the industry's broadest range of automated software applications to speed pass/fail testing to industry standards.
The analysis software provides jitter measurements for most key timing parameters required by high-speed serial data standards, and offers the greatest accuracy and lowest jitter noise measurements for the highest available bandwidth, four-channel real time oscilloscope on the market.
Many customer applications require connecting to signals through high bandwidth probes.
Connecting these probes to the scope changes the overall response of the scope and probe system.
The DSA70000 models offer user selectable DSP that compensates for connection of the P7313 Z-Active differential probe with the High Bandwidth Straight Flex Tip-Clip Assembly so that the full potential performance of the system is achieved with the probe attached.
The same advantages of bandwidth enhancement - flat signal response, linear phase response, and matched channels - and noise reduction now extend all the way to the probe tip.
With this new feature, any signal applied at the probe tip has the same fidelity as if it were connected directly to the scope input.
Engineers now have the ability of connecting to their signals with the P7313, directly via high frequency cables, or a mix of both at the same time, and retain full system performance and fidelity.
Full bandwidth to the tip support for more probes and tips, including the new P7513 and P7516 probes will be available within the next several months.
With this announcement, there are now DSA70000 models ranging from the 4GHz DSA70404 to the 20GHz DSA72004 designed for serial data applications.
These share the same basic platform with the DPO7000 and DPO70000 models designed for advanced digital test, beginning with 500MHz DPO7054.
Also now available are new DPO70000 models, also ranging from 12.5 to 20GHz.
All together there are 16 new oscilloscope models introduced within the last year based on this new generation architecture, a complete transformation of the mid-range and high-end Tektronix oscilloscopes.
Tektronix has announced the introduction of the industry's first ultra-high-performance oscilloscope with 20GHz real-time bandwidth and 50Gsample/s simultaneous sampling rate. The DSA70000 digital serial analyser (DSA) oscilloscope family includes several new models - 20GHz DSA72004, 16GHz DSA71604 and 12.5GHz DSA71254. These new products provide unmatched performance and analysis and extend the real-time DPO performance platform introduced last summer with 4-8GHz DSA models.
The DSA70000 series offers more four-channel performance than any alternative oscilloscopes and are ideal for the high-speed serial data applications of today and tomorrow.
The new Tektronix oscilloscopes are an integral part of the new high-speed serial data test bench, and will foster development of next generation products for the new digital world.
New generations of consumer, computing, communications, and video products and systems are emerging that use faster, wider information buses and interconnects - often using serial data architectures - within the underlying semiconductors and IC components.
Ultra-high-performance oscilloscopes are required to capture the frequency harmonics of high-speed serial signals to make accurate and repeatable measurements.
The DSA71000 and DSA72000 oscilloscopes provide support on all channels for ultra-high bandwidth, deep memory, fast sample rate, and fast waveform capture rate.
This is especially valuable for high speed multi-lane serial data architectures where multichannel analysis is needed for lane skew timing violations.
The models are ideal for design engineers developing and testing state-of-the-art serial data applications, including PCI-Express 2, SATA 3, FB-DIMM II, HDMI 1.3, and 10Gbit/s Ethernet.
'The need for high-end test equipment continues to escalate in keeping with market demands driving greater performance', said Colin Shepard, Vice President, Performance Oscilloscopes, Tektronix.
'Engineers need an oscilloscope that is free of compromises, that has leading specifications to keep pace with the performance curve, and that provides a complete, efficient and productive test solution'.
'The new DSA70000 models are the best real-time oscilloscopes yet developed, delivering the performance our customers need for high-speed multi-lane serial data applications and processor buses'.
'The new oscilloscopes provide the most extensive analysis and compliance measurements available and reinforce the Tektronix track record of innovation with the right technologies at the right time for the market'.
The new digital real-time (DRT) models provide the best combination of performance with 12.5, 16, and 20GHz version, 50Gsample/s maximum sample rate per channel, and up to 200Msample memory across all four channels.
A FastAcq acquisition mode waveform capture rate greater than 300,000 per second - about 1000 times faster than any competing alternative - with the DPX parallel architecture signal processor yields both critical insight into signal behaviour and in-depth analysis.
The unequaled combination of DRT and DPO ultrahigh performance on four channels simultaneously provides engineers with the industry-leading attributes they need for the most demanding test challenges.
Faster than any other, the new real-time oscilloscopes share a new generation scalable performance platform first introduced less than a year ago that makes broad use of IBM 7HP silicon germanium (SiGe) technology.
The 7HP SiGe technology offers peak performance for applications requiring high speed transfer of data, low noise, high linearity and low power consumption.
'The new DSA70000 oscilloscopes are the ultra-high performance products that Tektronix envisioned when work began several years ago with IBM on a 7HP silicon germanium implementation', said David Harame, Director of Enablement and IBM Fellow, Systems and Technology Group, IBM.
'The results of the collaboration are a test and measurement platform for the future, apparent in these transformational products'.
'The new DSA70000 products provide industry leading multi-channel performance, a requirement for design engineers developing next generation products'.
This level of performance is necessary for emerging 2nd and 3rd generation serial data technologies.
At 50Gsample/s and 200M record length, an engineer can capture more than 4 ms of data, ensuring the best resolution at full performance compared with alternative products.
The 20GHz DSA72004 provides 3rd harmonic measurements for datarates up to 12Gbit/s and 5th harmonic measurements on signals running up to 8Gbit/s.
This performance satisfies the signal integrity measurement and compliance requirements of the fastest chip-to-chip serial bus architectures.
With the DSA70000, Tektronix provides the performance and functionality most needed by design and test engineers working with high-speed serial databuses including the best multilayer analysis tools for the debug and validation of single and multilane signals.
The DSA70000 series instruments include leading Serial Compliance, Jitter and Timing Analysis tools that provide patented software clock recovery, RT-Eye Serial Compliance and Analysis Software, and a full battery of standard-specific parametric measurements.
The DSA70000 also includes hardware serial pattern triggering up to 3.125Gbit/s.
Engineers can add options for domain expertise that provide specific Pass/Fail waveform mask and measurement limit testing in conformance with industry-acknowledged standards.
The DSA70000 models can be optioned with the industry's broadest range of automated software applications to speed pass/fail testing to industry standards.
The analysis software provides jitter measurements for most key timing parameters required by high-speed serial data standards, and offers the greatest accuracy and lowest jitter noise measurements for the highest available bandwidth, four-channel real time oscilloscope on the market.
Many customer applications require connecting to signals through high bandwidth probes.
Connecting these probes to the scope changes the overall response of the scope and probe system.
The DSA70000 models offer user selectable DSP that compensates for connection of the P7313 Z-Active differential probe with the High Bandwidth Straight Flex Tip-Clip Assembly so that the full potential performance of the system is achieved with the probe attached.
The same advantages of bandwidth enhancement - flat signal response, linear phase response, and matched channels - and noise reduction now extend all the way to the probe tip.
With this new feature, any signal applied at the probe tip has the same fidelity as if it were connected directly to the scope input.
Engineers now have the ability of connecting to their signals with the P7313, directly via high frequency cables, or a mix of both at the same time, and retain full system performance and fidelity.
Full bandwidth to the tip support for more probes and tips, including the new P7513 and P7516 probes will be available within the next several months.
With this announcement, there are now DSA70000 models ranging from the 4GHz DSA70404 to the 20GHz DSA72004 designed for serial data applications.
These share the same basic platform with the DPO7000 and DPO70000 models designed for advanced digital test, beginning with 500MHz DPO7054.
Also now available are new DPO70000 models, also ranging from 12.5 to 20GHz.
All together there are 16 new oscilloscope models introduced within the last year based on this new generation architecture, a complete transformation of the mid-range and high-end Tektronix oscilloscopes.
# posted by Swathi @ 9:24 PM
Network analyser with integral second source
Agilent Technologies's new PNA-X microwave network analyser opearates in 10 MHz to 26.5 GHz range.
The PNA-X microwave network analyser from Agilent Technologies provides engineers with a novel single-connection means of making two-tone and swept LO measurements in the 10MHz to 26.5GHz range. The analyser has an internal second source and a signal-combining network. The PNA-X is suitable for engineers in the aerospace/defense and wireless communications industries developing and testing high-performance active devices such as amplifiers, mixers and convertors.
It is configurable in 2- or 4-port versions and is believed to be the only 2-port network analyser ot have an internal second source.
A new signal-routeing architecture allows it to be transformed from a pure network analyzer to an RF measurement hub for amplifiers and frequency convertors.
With two internal signal sources -- each with high output power (+16 dBm), low harmonics (-59 dBc), a wide power sweep range (40 dB), and a built-in pulse modulator and signal combiner, the PNA-X can perform amplifier intermodulation distortion, hot S22, traditional S-parameter and pulsed-S-parameter measurements along with harmonic and compression measurements.
The analyzer's integrated second source can be used as a fast fixed-IF or swept-LO signal for testing mixers and converters.
Speed improvements up to 35 times faster can be realised using the PNA's internal source as compared to using a traditional external source.
The PNA-X also has internal signal-routeing switches which provide increased flexibility for adding signal-conditioning hardware or additional test equipment for single-connection measurements.
This capability, coupled with the analyser's improved source performance, unmatched receiver compression (0.1 dB at +12 dBm) and stability, simplifies test setup and reduces the number of system calibrations required, while ensuring faster, more accurate measurements.
The PNA-X is believed to be the only network analyser with internal pulse modulators and generators for fast, simplified pulse measurements.
This enables pulse measurements to be taken 30 times faster compared with other analysers that require external generators and modulators.
The PNA-X network analyser's enhanced user interface comprising a large touch-screen display, eight soft keys and simplified hard-key arrangement make operation without a mouse easier than ever before.
These features also make it easier for engineers to read multiple measurements at the same time.
The new PNA-X exploits all existing features and capabilities of the PNA Series of network analysers, including: advanced connectivity via LAN, USB and GPIB; an easy-to-use Windows-based open architecture; an embedded help system; a frequency converter measurement application (FCA); and an automatic port extension.
It is also 100-percent code compatible with existing PNA Series analyzers.
An optional ECal feature enables fast, precision, single-connection calibration.
The PNA-X microwave network analyser from Agilent Technologies provides engineers with a novel single-connection means of making two-tone and swept LO measurements in the 10MHz to 26.5GHz range. The analyser has an internal second source and a signal-combining network. The PNA-X is suitable for engineers in the aerospace/defense and wireless communications industries developing and testing high-performance active devices such as amplifiers, mixers and convertors.
It is configurable in 2- or 4-port versions and is believed to be the only 2-port network analyser ot have an internal second source.
A new signal-routeing architecture allows it to be transformed from a pure network analyzer to an RF measurement hub for amplifiers and frequency convertors.
With two internal signal sources -- each with high output power (+16 dBm), low harmonics (-59 dBc), a wide power sweep range (40 dB), and a built-in pulse modulator and signal combiner, the PNA-X can perform amplifier intermodulation distortion, hot S22, traditional S-parameter and pulsed-S-parameter measurements along with harmonic and compression measurements.
The analyzer's integrated second source can be used as a fast fixed-IF or swept-LO signal for testing mixers and converters.
Speed improvements up to 35 times faster can be realised using the PNA's internal source as compared to using a traditional external source.
The PNA-X also has internal signal-routeing switches which provide increased flexibility for adding signal-conditioning hardware or additional test equipment for single-connection measurements.
This capability, coupled with the analyser's improved source performance, unmatched receiver compression (0.1 dB at +12 dBm) and stability, simplifies test setup and reduces the number of system calibrations required, while ensuring faster, more accurate measurements.
The PNA-X is believed to be the only network analyser with internal pulse modulators and generators for fast, simplified pulse measurements.
This enables pulse measurements to be taken 30 times faster compared with other analysers that require external generators and modulators.
The PNA-X network analyser's enhanced user interface comprising a large touch-screen display, eight soft keys and simplified hard-key arrangement make operation without a mouse easier than ever before.
These features also make it easier for engineers to read multiple measurements at the same time.
The new PNA-X exploits all existing features and capabilities of the PNA Series of network analysers, including: advanced connectivity via LAN, USB and GPIB; an easy-to-use Windows-based open architecture; an embedded help system; a frequency converter measurement application (FCA); and an automatic port extension.
It is also 100-percent code compatible with existing PNA Series analyzers.
An optional ECal feature enables fast, precision, single-connection calibration.
# posted by Swathi @ 9:24 PM
