Wednesday, February 28, 2007

 

Ease of use for GSM handset tester

Agilent has demonstrated at 3GSM a new test capability for Unlicensed Mobile Access/Generic Access Network (UMA/GAN) that promises low pricing and exceptional ease-of-use.

Agilent has demonstrated at 3GSM a new test capability for Unlicensed Mobile Access/Generic Access Network (UMA/GAN) that promises low pricing and exceptional ease-of-use. This one-box benchtop UMA/GAN test solution will initially be available via subscription release to Agilent 8960 Wireless Communications Test Set customers with E6720A annual contracts. UMA specifications are intended to extend mobile voice and data services over fixed WLAN.

These services are available to mobile users via dual-mode and UMA-enabled handsets.

Consumer acceptance of this new generation of handsets depends heavily on their ability to seamlessly transition between cellular and WLAN networks during calls, while using services such as SMS/MMS, Web browsing and in idle mode.

Protocol developers and integration engineers, therefore, require an easy-to-use, comprehensive solution for testing the functional aspects of UMA/GAN, as well as to ascertain whether handovers occur at the correct parametric conditions and that all services are correctly managed throughout the transition.

Previously, to perform these tests, engineers would have been required to use a substantially more costly conformance test system.

With Agilent's one-box tester, all testing takes place on a bench rather than getting access to a system rack.

Engineers simply connect the equipment and begin testing.

'Today's engineers require cost-effective, easy-to-use measurement solutions that provide broad test coverage for stress test, validation and regression testing across RF, protocol and software', says Earl Thompson, Vice President and General Manager of Agilent's Wireless Division.

'Agilent's subscription release of the UMA/GAN capability reiterates our continued commitment to deliver cost effective, innovative and value-added solutions to manufacturing and RandD activities worldwide in support of new and emerging communication technologies like UMA'.

Agilent's new UMA/GAN handover testing capability will initially be available only via the Agilent E6720A Lab Application annual contract.

This contract not only offers all new official releases that are available during the contract period, but also gives customers access to subscription releases, which are early releases of leading-edge test capabilities such as UMA/GAN.

 

Test catalogue tutorials simplify selection

Keithley Instruments has published its 2007 Test and Measurement Product Catalogue. This desktop reference guide offers details and specifications on Keithley's general-purpose and sensitive sourcing and measurement products, DC switching, RF switching and measurement, data acquisition solutions, semiconductor test systems, and optoelectronics test hardware. Tutorials simplify choosing solutions for specific applications.

Arranged by major product type and application area, each section of the catalogue contains a tutorial on test-system design and use with practical tips to help users avoid common measurement errors, increase productivity, and lower their cost of test.

The major catalogue sections include: digital multimeters and systems; switching and control; RF/microwave switching and instruments; specialised power supplies; source and measure products; low level measurements and sourcing; pulse/pattern generators; PXI hybrid system products; optoelectronic test; semiconductor test; and data acquisition products.

 

FlexRay options aid automotive testing

Automotive test products can easily be integrated in complex, automated functional test configurations, which can be leveraged from design validation into production.

At Embedded World, Agilent Technologies introduced a number of product options to help automotive engineers develop their electronic products faster and under budget, while meeting quality requirements. These automotive test products can easily be integrated in complex, automated functional test configurations, which can be leveraged from design validation into production. A FlexRay option for the Agilent 6000 series mixed signal oscilloscopes offers a robust set of FlexRay frame, slot and error triggering, including the ability to trigger on specific FlexRay communications qualified on base-cycle and cycle-repetition.

A FlexRay extension to the Agilent 16800 and 16900 Series logic analyser provides FlexRay packet decoding capabilities and is essential when debugging and validating activity between multiple buses in an automotive system.

Analysis includes timing between signals, inverse assembly and packet display for key buses, as well as time-correlation of protocol packets to CPU and memory bus activity.

'New advanced driver assistance systems will further connect subsystems within the car, and from cars to cars and cars to the infrastructure', said Roland Jeutter, Automotive Business Manager at Agilent Technologies Germany.

'Our new automotive products help to master new technologies and the increasing complexity of these advanced electronic control units'.

To ensure that the advanced electrical/electronic system of a vehicle stays within the limits for the electromagnetic emissions, Agilent has added support for the widely adopted measurement methods defined in the CISPR25 standard.

As unveiled at IEEE EMC 2006, Agilent's fully CISPR16-compliant solution will be released later this year.

In addition to making CISPR25 measurements, the Agilent solution, which is based on the Performance spectrum analyser (PSA), will allow testing throughput not seen in previous-generation EMI receivers, at a competitive price.

 

Oscilloscope turns to FlexRay measurements

Measurement system provides the highest-level FlexRay triggering and protocol decode measurements available in an oscilloscope.

Agilent Technologies and Dependable Computer Systems (Decomsys) have introduced a measurement system that provides the highest-level FlexRay triggering and protocol decode measurements available in an oscilloscope. This new measurement solution allows automotive designers who use embedded microprocessors to verify proper signal integrity of their FlexRay signals and proper timing of the time-triggered communication bus. The measurement system combines an Agilent 6000 Series mixed signal oscilloscope (MSO) with a Decomsys::Busdoctor 2 protocol analyser to provide the first time-correlated slot/segment boundary display of the global FlexRay timing schedule on an oscilloscope.

The FlexRay serial bus is an automotive communication bus with a time-triggered, deterministic architecture.

This higher-performance and fault-tolerant serial bus is gaining rapid adoption in the design of some of today's higher-end automobiles including BMW's X5 SUV, where it initially is being used to support a suspension application.

Because of the fault-tolerant nature of the FlexRay protocol, FlexRay technology is expected to be used in the near future for many safety-critical applications such as steer-by-wire, brake-by-wire and collision-avoidance systems.

When used in combination with the Decomsys::Busdoctor 2 protocol analyser, Agilent's FlexRay option for the 6000 Series mixed signal oscilloscopes offers a robust set of FlexRay frame, slot and error triggering, including the ability to trigger on specific FlexRay communications qualified on base-cycle and cycle-repetition.

Designers can see a synchronous and time-correlated display of segment and slot-timing boundaries by importing a Fibex file that defines the global FlexRay schedule directly into the 6000 Series mixed signal oscilloscope.

This capability allows the system to be used as a stand-alone tester (no external PC required).

Alternatively, the Decomsys::Busdoctor 2 and MSO can be configured for synchronous operation using Decomsys' Vision software package.

This type of system configuration provides higher-level FlexRay protocol analysis measurements on the PC and time-correlated FlexRay measurements on the oscilloscope's display.

The Agilent N5432A FlexRay triggering and real-time decode option for the 6000 Series mixed signal oscilloscope is priced at $2500.

The Decomsys::Busdoctor 2 FlexRay protocol analyser and optional MSO communication cable can be ordered directly from Decomsys.

 

Alliance targets Mobile WiMAX testing

Agilent Technologies and Beceem Communications have signed an agreement to develop high-speed manufacturing test solutions for mobile WiMAX devices based on the IEEE802.16e-2005 standard.

Agilent Technologies and Beceem Communications have signed an agreement to develop high-speed manufacturing test solutions for mobile WiMAX devices based on the IEEE802.16e-2005 standard. Agilent will initially develop a new test system based on the MXA signal analyser and MXG signal generator for WiMAX, and Agilent's test executive and control software. This test system will be optimised to directly control Beceem's MS120 baseband and RF chipset and the WiMAX modem software, thus enabling the highest possible measurement throughput.

Beceem will certify Agilent's test systems for use by manufacturers that are developing mobile WiMAX products based on the MS120 chipset.

'We are truly excited to be working so closely with Beceem', said Pat Byrne, President of Agilent's Electronic Measurement Group.

'Beceem is a leading chipset vendor in Mobile WiMAX, and is in a first-mover market position with shipping well-qualified chipsets and reference designs for this rapidly growing industry'.

'Agilent is a leader in test equipment for CDMA, GSM and WCDMA, and it's our pleasure to work with them to accelerate the mobile WiMAX market', said Babu Mandava, President of Beceem Communications.

'Solutions like Agilent's are critical for enabling OEMs and ODMs to develop and test their WiMAX products, both in their labs and in production'.

Friday, February 23, 2007

 

Protocol tester turns to multimedia broadcasting

Anritsu has developed a 'first-to-market' MBMS test solution for its highly successful PTS (Protocol Test System), confirming its leadership position in 3G research and development test.

A heritage of collaboration with industry leading terminal manufacturers enables Anritsu to announce a 'first-to-market' MBMS test solution for its highly successful PTS (Protocol Test System), confirming its leadership position in 3G research and development test. MBMS physical layer test capability was first launched in the MD8480C W-CDMA signalling tester in January 2007. Initial layer 3 test functionality will be introduced into the Protocol Test System (PTS) in February with further MBMS enhancements planned during the year.

An MBMS protocol conformance test capability for GCF certification is also planned.

MBMS (Multimedia Broadcast/Multicast Service) introduced in 3GPP Release 6, is a feature which offers two new bearer services, Broadcast Mode and Multicast Mode, enabling the delivery of multimedia content directly to handsets via point-to-point or point-to-multipoint transmission.

This is achieved either as a stream which is played back at the receiver in near-real time or as one or more files downloaded to the device for playback at a convenient time.

The growth in demand for point-to-point high bandwidth content delivery such as real time streaming and video services is currently being constrained by available network capacity.

By providing MBMS test functionality Anritsu is meeting industry demand head on, playing a pivotal role in enabling the delivery and transmission of content via MBMS which in turn provides improved network resource sharing, enabling the efficient usage of radio-network and core-network resources.

MBMS is an attractive upgrade to current infrastructure services as it requires no hardware modifications and will not affect current capacity for voice and data communications.

It is envisaged that MBMS will be the primary vehicle for, streaming and downloading services over the UE and as such will provide operators with a method of user initiated content targeting and greatly improved revenue streams.

 

Preventive monitoring to protect digital TV

Pixelmetrix, the global expert in Preventive Monitoring for digital television and IPTV networks, will present its latest line of innovative devices come April at NAB 2007, Las Vegas.

Pixelmetrix, the global expert in Preventive Monitoring for digital television and IPTV networks, will present its latest line of innovative devices for preventitive monitoring in April at NAB 2007, Las Vegas. Its new portfolio of solutions is targeted at IPTV, terrestrial, satellite and cable market players to clinch optimum system performance and service delivery. Highlights at the Pixelmetrix booth SU12109 will include the integration of its DVStation-IP and DVStorIP-Gen, featuring end-to-end commissioning and testing of IPTV networks.

Exclusive previews of DVB-S2 and DVB-H are also on the agenda.

'At NAB 2007, we are introducing the bundling of our slew of advanced tools to fulfill the need for IPTV quality of experience and quality of service, disaster recovery, compliance recording and streamlined headend monitoring, just to name a few', says Danny Wilson, President and CEO of Pixelmetrix.

'The aim is to help operators and service providers bolster their confidence to create an efficient infrastructure, align their IPTV deployments and assure successful implementation and execution'.

Pixelmetrix will also exhibit the dynamic enhanced features of its DVShift MPEG-TS time shifter and DVStor transport storage and playback system.

On the Visualmpeg showcase, real-time elementary stream and video quality analysis will be covered.

Pixelmetrix develops a host of IPTV and preventive monitoring systems that offer unique attributes and versatility, allowing operators to achieve end-to-end visibility and keep tabs on their network architecture.

 

Optical tester guards against signal attenuation

EXFO Electro-Optical Engineering has launched the IQS-3150 Variable Optical Attenuator (VOA) for optical network testing and active component manufacturing applications.

Exfo Electro-Optical Engineering has launched the IQS-3150 Variable Optical Attenuator (VOA) for optical network testing and active component manufacturing applications. The VOA offers an attenuation range of 65dB and spectral uniformity (+/-0.03dB over the C-band) as well as an optional intelligent function (integrated power meter). This new IQS module can be used in an automated testing environment to simulate the loss of optical power or increased link attenuation.

It combines reliable performance, complete control of the signal level, advanced programming capabilities and user-friendliness inside a one-slot singlemode or multimode module within the IQS-500 Intelligent Test System.

The IQS-3150 VOA has been designed to meet the requirements of the most extensive manufacturing applications in which 24 x 7 operation over a period of five years or more is needed.

When equipped with the optional power meter, the instrument can be set to reach a calibrated output power level instead of a known level of attenuation.

This two-in-one option eliminates the need for an external power meter and simplifies test setups.

'Our variable optical attenuator represents a key building block in the development of a multitude of automated test stations for manufacturing, system verification or RandD applications', says Etienne Gagnon, Exfo's Vice-President of Optical and Protocol Product Management.

'A wide range of optical and protocol test modules can be combined to create high-performance test stations like those required for BER testing of transmission cards or gain and noise characterisation of erbium-doped fiber amplifiers (EDFAs)'.

'Combined with the integrated power meter option, this new VOA increases the flexibility and stability of such test stations'.

 

Analyser evolves to handle power over Ethernet

The DTX CableAnalyzer can now validate twisted-pair cabling links that use midspan power-over-Ethernet controllers, in accordance with TIA/EIA standards.

Fluke Networks has added a new capability to its industry-leading DTX CableAnalyzer Series. The DTX CableAnalyzer can now validate twisted-pair cabling links that use midspan power-over-Ethernet (PoE) controllers, in accordance with TIA/EIA standards. DTX AC Wiremap tests the wiring in each link to assure that VoIP phones, wireless access points, security cameras and other PoE devices will work with midspan power supplies before deployment, and to identify failures that may appear after deployment.

'This capability solves a testing issue that has been problematic for Power-over-Ethernet consumers', said John Schmidt, Senior Product Manager, Structured Cabling Systems for ADC.

'The ability to properly test through a PoE midspan is essential to certifying modern Ethernet networks'.

Ordinary wiremap tests fail when working with midspan power supplies, as the power supplies block the wiremap test signals from flowing in the direction of the Ethernet switch or hub.

As the name implies, the new DTX AC Wiremap test uses Alternating Current and innovative analysis methods that are unaffected by a midspan supply to provide accurate wiremap tests.

'We believe this new capability will enable current and future PoE installations to be easily tested with a single device making PoE Midspan devices easy to test and integrate into structured cabling systems', said Michael K Pula, Product Line Manager, Panduit Managed Network Solutions.

The DTX AC Wiremap test also diagnoses failures by determining the distance to the point of failure, possible reason(s) for the failure and corrective actions, saving time and allowing technicians with a wide range skill levels to understand and correct the problem.

The use of PoE is growing 20 to 30% per year.

Rapid increase in the use of VoIP phones, wireless access points and other PoE devices has made the powered network essential to businesses.

This is especially true where existing infrastructure, such as expensive switches and routers, is being coupled with new midspan power supplies.

The need for accurate testing on PoE networks is now mission critical.

The new DTX AC Wiremap test is now a standard feature on all DTX CableAnalyzers, can be added to existing units as a no-cost upgrade.

 

Digital ohmmeter for low resistance measurement

The Cropico DO4A is a versatile digital ohmmeter used for low resistance measurement across a diverse range of engineering and power system safety applications.

The Cropico DO4A is a versatile digital ohmmeter used for low resistance measurement across a diverse range of engineering and power system safety applications. The DO4A uses True 4 Wire measurement to eliminate lead resistance errors across a push button selectable range from 40mW to 4kW with respective resolutions between 10mW and 1W. Contained in an aluminium case with a tilted carrying handle, the robust unit can be used in the workshop, by field or maintenance engineers or as part of more comprehensive electrical test facilities.

Input protection is provided up to 415V RMS.

For ease of operation the control functions have been kept to a minimum and a four-digit LCD gives direct readings of the resistance measured, with over-range and low-battery indicators also provided.

Other special features include an auto zero facility where thermal EMF may cause a large measuring error and warning LEDs to indicate an open circuit lead condition.

Rechargeable batteries provide full portability with over 14hr of continuous working on the lowest ranges and 28hr operation on others.

The Cropico DO4A is supplied ready for immediate use and comes complete with battery, mains cord and measuring leads.

In addition, a wide range of optional accessories including duplex handspikes, other specialist clips, long length leads and wire clamps further extend the instrument's versatility.

Wednesday, February 14, 2007

 

Digital Serial Analysers test high-speed data

The DSA70000 real-time Digital Serial Analysers (DSA) and P7500 probes from Tektronix test the next generation of high-speed serial data applications such as PCI-Express 2.0, HDMI 1.3, and SATA III.

Tektronix has brought out a new line of DSA70000 real-time Digital Serial Analysers (DSA) and P7500 probes, both providing high-speed performance for the next generation of fast serial data applications such as PCI-Express 2.0, HDMI 1.3, and SATA III. The latest serial technologies are faster and more complex than prior generations and require better test equipment capable of greater performance and more extensive analysis. 'Tektronix is intimate with the latest technologies that underpin the fast data buses inside PCs, entertainment systems, networks, new wireless standards, and with on-demand delivery of digital video over converged multi-carrier networks that are integral to the new digital world', said Rick Wills, Chairman and CEO, Tektronix.

'With our latest announcements, customers have access to the most advanced instruments and software available for testing their high-speed serial data designs'.

The new real-time DSA70000 Series with bandwidth to 20GHz are said to be the world's fastest 4-channel real-time oscilloscopes, and the P7500 Series are claimed to be the world's fastest active differential probes.

'2nd and 3rd generation serial data technologies provide order of magnitude greater data throughput than possible only a few years ago and now underpin the fastest product designs', said Martyn Etherington, Vice President, Instruments Business, Tektronix.

'With the new DSA70000 Series real-time oscilloscopes, DSA8200 sampling oscilloscopes, AWG7000 arbitrary waveform generators, and P7500 series probes, engineers have access to an entirely new portfolio with the capabilities needed to develop next generation products incorporating high-speed serial data technologies''.

The DSA7000 Analysers have up to 20GHz bandwidth on all four channels simultaneously, 50 Gsample/s on all four channels, up to 200Mbyte memory on all four channels, and more than 300,000 waveforms captured per second to provide both critical insight into signal behaviour and in-depth analysis.

The new models include 12.5GHz, 16GHz, and 20GHz versions.

The DSA70000 series instruments include leading Serial Compliance, Jitter and Timing Analysis tools that provide patented software clock recovery, RT-Eye Serial Compliance and Analysis Software, and a full battery of standard-specific parametric measurements.

The new DSA70000 can be optioned with the industry's broadest range of automated software applications to speed pass/fail testing to industry standards such as PCI Express, SATA, FB-DIMM, HDMI and more.

 

Inspection system for computerised tomography

The X-Tek Group will announce a new camera and detector combination for the Revolution NanoTech X-ray inspection system at APEX 2007.

The X-Tek Group, one of the world's leading manufacturers of real-time microfocus X-ray systems, will announce a new camera and detector combination for the Revolution NanoTech X-ray inspection system and a new validation station for enhanced production capability at APEX, Booth 2237. Visitors to the X-Tek booth will also be able to experience a demonstration of computerised tomography (CT), a powerful new 3D imaging capability to the industry leading Revolution system. Impix, the new scientific grade camera and detector combination, further improves the dynamic range, accuracy, repeatability and feature recognition capability of the Revolution.

The camera boasts real-time frame rates at full camera resolution and full dynamic range.

Using the X-Tek InspectX image enhancement software the X-ray image is displayed on a separate LCD monitor for clutter free viewing.

The Revolution provides over 65 thousand levels of grey to assist in distinguishing fine features in components.

Supplied with X-Tek's On Chip Integration feature, the Revolution is also capable of imaging very transparent materials at very low X-ray energies.

The Impix camera will also enhance the CT option on the Revolution by further improving the voxel resolution capability.

The validation station option allows viewing/reviewing of captured data offline, enabling continued use of the X-ray system for production.

Data can be accessed remotely by serial number or by barcode scanning.

X-Tek's CT capability has recently received extensive global recognition.

X-Tek pioneered a powerful new X-ray source which allowed an international team of researchers to reveal the true purpose of one of the most technically advanced artefacts from the Greek classical world, the Antikythera mechanism.

X-Tek specifically developed a new 450kV microfocus X-ray source for the project, a dramatic advancement over the conventional 225kV source.

The results from X-Tek's new CT system provided researchers with new material and enabled them to read inscriptions that had never been seen before.

CT produces high resolution 3D data sets which can be viewed at any angle, sliced in any direction and measured to enable detailed analysis of the internal structure of a wide range of components and objects.

X-Tek has made true 3D imaging available, affordable and simple to use for fast internal analysis, measurement, reverse engineering and product verification.

The Revolution features submicron defect detection, 75 degree oblique viewing, digital detectors and automatic BGA software.

Offering the highest degree of off axis tilt available and NanoTech open tube technology for unparalleled resolution and magnification, visitors are invited to bring a sample with them to the X-Tek booth to test the system's capability.

The Revolution offers maximum magnification (up to 6000x) at all angles over the entire 410 x 410mm manipulator scan area, for 100% BGA, micro-BGA, multilayer board and PCB solder joint inspection, with quick analysis of BGA ball wetting, attachment, cracks and delaminations.

 

Clamp-on meters are easy to handle

Fully functional clamp meters with simplified interfaces and easy-to-read, oversized display screens help technicians get their work done quickly and easily.

Amprobe Test Tools introduces the ACDC-100 and ACDC-100 TRMS digital clamp-ons, fully functional clamp meters with simplified interfaces and easy-to-read, oversized display screens to help technicians get their work done quickly and easily. Both models feature auto and manual ranging, relative zero mode, max capture for inrush current measurements (30ms response), auto power off, data hold, diode test, audible continuity and 'third hand' test probe holder. The ACDC-100 TRMS features true RMS measurements and a backlit display.

The clamp-ons are safety rated CAT III 600 V.

The ergonomics of the ACDC100 are enhanced by Amprobe's Red, Rubber, Ribs design, making it easy to handle.

The rubber overmoulded case includes built-in probe storage.

The ACDC-100 and ACDC-100 TRMS come with carrying cases, test leads, two AAA batteries and user manual.

 

Oscilloscopes are digital serial analysers

Tektronix has announced the introduction of the industry's first ultra-high-performance oscilloscope with 20GHz real-time bandwidth and 50Gsample/s simultaneous sampling rate.

Tektronix has announced the introduction of the industry's first ultra-high-performance oscilloscope with 20GHz real-time bandwidth and 50Gsample/s simultaneous sampling rate. The DSA70000 digital serial analyser (DSA) oscilloscope family includes several new models - 20GHz DSA72004, 16GHz DSA71604 and 12.5GHz DSA71254. These new products provide unmatched performance and analysis and extend the real-time DPO performance platform introduced last summer with 4-8GHz DSA models.

The DSA70000 series offers more four-channel performance than any alternative oscilloscopes and are ideal for the high-speed serial data applications of today and tomorrow.

The new Tektronix oscilloscopes are an integral part of the new high-speed serial data test bench, and will foster development of next generation products for the new digital world.

New generations of consumer, computing, communications, and video products and systems are emerging that use faster, wider information buses and interconnects - often using serial data architectures - within the underlying semiconductors and IC components.

Ultra-high-performance oscilloscopes are required to capture the frequency harmonics of high-speed serial signals to make accurate and repeatable measurements.

The DSA71000 and DSA72000 oscilloscopes provide support on all channels for ultra-high bandwidth, deep memory, fast sample rate, and fast waveform capture rate.

This is especially valuable for high speed multi-lane serial data architectures where multichannel analysis is needed for lane skew timing violations.

The models are ideal for design engineers developing and testing state-of-the-art serial data applications, including PCI-Express 2, SATA 3, FB-DIMM II, HDMI 1.3, and 10Gbit/s Ethernet.

'The need for high-end test equipment continues to escalate in keeping with market demands driving greater performance', said Colin Shepard, Vice President, Performance Oscilloscopes, Tektronix.

'Engineers need an oscilloscope that is free of compromises, that has leading specifications to keep pace with the performance curve, and that provides a complete, efficient and productive test solution'.

'The new DSA70000 models are the best real-time oscilloscopes yet developed, delivering the performance our customers need for high-speed multi-lane serial data applications and processor buses'.

'The new oscilloscopes provide the most extensive analysis and compliance measurements available and reinforce the Tektronix track record of innovation with the right technologies at the right time for the market'.

The new digital real-time (DRT) models provide the best combination of performance with 12.5, 16, and 20GHz version, 50Gsample/s maximum sample rate per channel, and up to 200Msample memory across all four channels.

A FastAcq acquisition mode waveform capture rate greater than 300,000 per second - about 1000 times faster than any competing alternative - with the DPX parallel architecture signal processor yields both critical insight into signal behaviour and in-depth analysis.

The unequaled combination of DRT and DPO ultrahigh performance on four channels simultaneously provides engineers with the industry-leading attributes they need for the most demanding test challenges.

Faster than any other, the new real-time oscilloscopes share a new generation scalable performance platform first introduced less than a year ago that makes broad use of IBM 7HP silicon germanium (SiGe) technology.

The 7HP SiGe technology offers peak performance for applications requiring high speed transfer of data, low noise, high linearity and low power consumption.

'The new DSA70000 oscilloscopes are the ultra-high performance products that Tektronix envisioned when work began several years ago with IBM on a 7HP silicon germanium implementation', said David Harame, Director of Enablement and IBM Fellow, Systems and Technology Group, IBM.

'The results of the collaboration are a test and measurement platform for the future, apparent in these transformational products'.

'The new DSA70000 products provide industry leading multi-channel performance, a requirement for design engineers developing next generation products'.

This level of performance is necessary for emerging 2nd and 3rd generation serial data technologies.

At 50Gsample/s and 200M record length, an engineer can capture more than 4 ms of data, ensuring the best resolution at full performance compared with alternative products.

The 20GHz DSA72004 provides 3rd harmonic measurements for datarates up to 12Gbit/s and 5th harmonic measurements on signals running up to 8Gbit/s.

This performance satisfies the signal integrity measurement and compliance requirements of the fastest chip-to-chip serial bus architectures.

With the DSA70000, Tektronix provides the performance and functionality most needed by design and test engineers working with high-speed serial databuses including the best multilayer analysis tools for the debug and validation of single and multilane signals.

The DSA70000 series instruments include leading Serial Compliance, Jitter and Timing Analysis tools that provide patented software clock recovery, RT-Eye Serial Compliance and Analysis Software, and a full battery of standard-specific parametric measurements.

The DSA70000 also includes hardware serial pattern triggering up to 3.125Gbit/s.

Engineers can add options for domain expertise that provide specific Pass/Fail waveform mask and measurement limit testing in conformance with industry-acknowledged standards.

The DSA70000 models can be optioned with the industry's broadest range of automated software applications to speed pass/fail testing to industry standards.

The analysis software provides jitter measurements for most key timing parameters required by high-speed serial data standards, and offers the greatest accuracy and lowest jitter noise measurements for the highest available bandwidth, four-channel real time oscilloscope on the market.

Many customer applications require connecting to signals through high bandwidth probes.

Connecting these probes to the scope changes the overall response of the scope and probe system.

The DSA70000 models offer user selectable DSP that compensates for connection of the P7313 Z-Active differential probe with the High Bandwidth Straight Flex Tip-Clip Assembly so that the full potential performance of the system is achieved with the probe attached.

The same advantages of bandwidth enhancement - flat signal response, linear phase response, and matched channels - and noise reduction now extend all the way to the probe tip.

With this new feature, any signal applied at the probe tip has the same fidelity as if it were connected directly to the scope input.

Engineers now have the ability of connecting to their signals with the P7313, directly via high frequency cables, or a mix of both at the same time, and retain full system performance and fidelity.

Full bandwidth to the tip support for more probes and tips, including the new P7513 and P7516 probes will be available within the next several months.

With this announcement, there are now DSA70000 models ranging from the 4GHz DSA70404 to the 20GHz DSA72004 designed for serial data applications.

These share the same basic platform with the DPO7000 and DPO70000 models designed for advanced digital test, beginning with 500MHz DPO7054.

Also now available are new DPO70000 models, also ranging from 12.5 to 20GHz.

All together there are 16 new oscilloscope models introduced within the last year based on this new generation architecture, a complete transformation of the mid-range and high-end Tektronix oscilloscopes.

 

Network analyser with integral second source

Agilent Technologies's new PNA-X microwave network analyser opearates in 10 MHz to 26.5 GHz range.

The PNA-X microwave network analyser from Agilent Technologies provides engineers with a novel single-connection means of making two-tone and swept LO measurements in the 10MHz to 26.5GHz range. The analyser has an internal second source and a signal-combining network. The PNA-X is suitable for engineers in the aerospace/defense and wireless communications industries developing and testing high-performance active devices such as amplifiers, mixers and convertors.

It is configurable in 2- or 4-port versions and is believed to be the only 2-port network analyser ot have an internal second source.

A new signal-routeing architecture allows it to be transformed from a pure network analyzer to an RF measurement hub for amplifiers and frequency convertors.

With two internal signal sources -- each with high output power (+16 dBm), low harmonics (-59 dBc), a wide power sweep range (40 dB), and a built-in pulse modulator and signal combiner, the PNA-X can perform amplifier intermodulation distortion, hot S22, traditional S-parameter and pulsed-S-parameter measurements along with harmonic and compression measurements.

The analyzer's integrated second source can be used as a fast fixed-IF or swept-LO signal for testing mixers and converters.

Speed improvements up to 35 times faster can be realised using the PNA's internal source as compared to using a traditional external source.

The PNA-X also has internal signal-routeing switches which provide increased flexibility for adding signal-conditioning hardware or additional test equipment for single-connection measurements.

This capability, coupled with the analyser's improved source performance, unmatched receiver compression (0.1 dB at +12 dBm) and stability, simplifies test setup and reduces the number of system calibrations required, while ensuring faster, more accurate measurements.

The PNA-X is believed to be the only network analyser with internal pulse modulators and generators for fast, simplified pulse measurements.

This enables pulse measurements to be taken 30 times faster compared with other analysers that require external generators and modulators.

The PNA-X network analyser's enhanced user interface comprising a large touch-screen display, eight soft keys and simplified hard-key arrangement make operation without a mouse easier than ever before.

These features also make it easier for engineers to read multiple measurements at the same time.

The new PNA-X exploits all existing features and capabilities of the PNA Series of network analysers, including: advanced connectivity via LAN, USB and GPIB; an easy-to-use Windows-based open architecture; an embedded help system; a frequency converter measurement application (FCA); and an automatic port extension.

It is also 100-percent code compatible with existing PNA Series analyzers.

An optional ECal feature enables fast, precision, single-connection calibration.

Thursday, February 08, 2007

 

Bit-error-rate tester takes DesignVision Award

Agilent Technologies has won a 2007 DesignVision Award in the test and measurement category for its J-BERT N4903A.

Agilent Technologies has won a 2007 DesignVision Award in the test and measurement category for its J-BERT N4903A, a high-performance serial bit-error-rate tester with an industry-first built-in, compliant and tunable clock data recovery (CDR). The International Engineering Consortium (IEC), which presents the DesignVision Awards, acknowledges individuals and companies that offer innovative and unique applications, products, technologies and services of impact to the semiconductor industry. IEC President John Janowiak commented: 'Our DesignVision Awards honour those catalyzing positive change in high-technology, business and academia, completely in line with the IEC's mission'.

'We are delighted to recognise the DesignVision finalists and share the best design advancements and innovators with the entire industry'.

The J-BERT N4903A is the only complete jitter tolerance test solution.

It provides integrated and calibrated jitter sources for stressed eye testing of gigabit receivers.

The new compliant and tunable CDR is also integrated into the J-BERT box.

This enables engineers in characterisation and validation labs to get precise jitter budget results for clock-less devices.

Engineers save test setup time by using J-BERT's new library of compliant CDR settings for many popular standards, such as PCI Express, Serial Advanced Technology Attachment (SATA), Fibre Channel, fully buffered DIMM, Common Electrical interface (CEI), 10Gbit/s Ethernet and XFP/XFI.

'We are pleased to be honoured by the IEC for the J-BERT N4903A with CDR', said Sigi Gross, Vice President and General Manager of Agilent's Digital Verification Solutions Division.

 

Ethernet testing moves to higher layers

Exfo Electro-Optical Engineering has a new Ethernet test module, the FTB-8510B Packet Blazer, for advanced Ethernet and higher-layer test applications.

Exfo Electro-Optical Engineering has a new Ethernet test module, the FTB-8510B Packet Blazer, for advanced Ethernet and higher-layer test applications. Building on the strong technical base of its predecessor, the FTB-8510, this new module enhances Exfo's Ethernet testing capabilities and provides support for the growing demand in higher-layer protocol testing and service validation. Among its many enhancements, the FTB-8510B delivers wire-speed transmission control protocol (TCP) throughput measurements, adding key test metrics for carrier-grade Ethernet network performance validation.

This new feature allows customers to further qualify their service-level agreements (SLAs) by providing performance indicators relevant to the transmission of application data over a reliable TCP connection.

The FTB-8510B Packet Blazer now supports standardised 100Mbit/s optical Ethernet connections, while continuing to offer the full range of electrical 10/100/1000Mbit/s and 1000Mbit/s optical/physical interfaces - all within the same test module.

With 100Mbit/s optical interfaces at the heart of active Ethernet broadband access deployments worldwide, the FTB-8510B is the ideal product to address active Ethernet link performance validation.

'Exfo's innovative TCP throughput measurement feature on the new FTB-8510B Packet Blazer represents an industry first in the portable test equipment market', said Etienne Gagnon, Exfo's Vice-President of Protocol and Optical Product Management.

'It provides our customers with unmatched capabilities to validate the application performance of their networks'.

'Once again, Exfo has demonstrated its full commitment to the rapidly evolving Ethernet market by adding key features to its technology- leading Packet Blazer test family'.

The FTB-8510B Packet Blazer is available on the FTB-200 Compact Platform and the FTB-400 Universal Test System for field-testing and central office applications.

Its counterpart, the IQS-8510B can be hosted inside the IQS-500 Intelligent Test System for manufacturing and R and D test applications.

 

Emerging technologies in focus at 3GSM

At 3GSM 2007, Anritsu will demonstrate a portfolio of solutions confirming a roadmap which sets the pace which will enable emerging technologies.

At 3GSM 2007, Anritsu will demonstrate a portfolio of solutions confirming a roadmap which sets the pace which will enable emerging technologies such as long term evolution and next generation networks. 3GSM will also see Anritsu announce its continued leadership in providing HSUPA protocol test cases approved by the GCF which follows the submission of the first 3GPP HSUPA conformance test case in September 2006. Anritsu's strong involvement in standards development and world leading solutions for conformance test allows it to offer solutions for later stages of the lifecycle.

For example, Anritsu is actively testing 4G networks Anritsu will showcase leading edge solutions for the mobile communications market covering development, verification, production, installation and maintenance as well as end-to-end quality test and monitoring and service quality optimisation.

These cover all wireless and converged networks and services and will include HSUPA, HSDPA, WiMAX and MBMS solutions for user equipment and infrastructure manufacturers.

Building on its acquisition of NetTest, Anritsu has developed OSS service assurance and service optimisation solutions key to improving service quality, revenue and profitability for mobile operators.

Our Service Assurance portfolio includes solutions for GSM,/GPRS, UMTS/HSPA, VoIP, IMS and IPTV networks and services.

New products and key technology developments showcased at 3GSM will include the following.

Anritsu's MD8480C signalling simulator offers HSPA with full rate HSUPA 5.7Mbit/s and HSDPA 14.4Mbit/s, R99 and intra-system handover capabilities.

Anritsu will launch HSPA on its MD8470A with full rate HSUPA and HSDPA functionality, adding throughput measurement capability for analysis of mobile application efficiency.

A key part of Anritsu's OSS portfolio, MasterClaw increases revenue and reduces operational expense by enabling faster resolution of network and service issues, promoting customer retention and usage and improving operational efficiency.

A nonintrusive monitoring system providing full end-to-end monitoring of converged networks, MasterClaw is the leading service and network monitoring system for GSM/GPRS, UMTS/HSPA, SS7, VoIP, IMS and IPTV networks.

3GSM will see MasterClaw showcasing the company's newest mobile broadband Service Assurance solutions, including a new service management application and the latest release of Traffic Observer, a real-time application for NOC centre operations purposes.

Visitors will also see the new IMS deployment and troubleshooting applications, and also our latest end-to-end HSPA monitoring solutions.

NetClaw is a key solution for enabling rapid network fault restoration, improving service quality and directly impacting service turn-up and pay-back.

NetClaw, an advanced network and service performance analyser is designed to quickly provision, troubleshoot and optimise existing and emerging services across GSM/GPRS, UMTS/HSPA, SS7, VoIP, IMS and IPTV domains.

With advanced applications for service testing, network monitoring, and data acquisition for next-generation networks in a single box, NetClaw is a scalable and easy-to-use solution for remote and local operation across fixed and mobile domains.

NetClaw is being shown live at 3GSM and we are featuring our new MMS and HSDPA applications.

Radio infrastructure test solutions reduce capex and improve service roll-out.

Anritsu's radio infrastructure test solutions reduce capex and improve service roll-out, raising operational efficiency.

The range of solutions on show at 3GSM includes the BTS Master handheld basestation analyser (MT8222A), a true one-stop solution for wireless field technicians working with GSM/GPRS/Edge/WCDMA/HSPSA).

Other solutions include the MS8911B digital broadcast field analyser, the only complete handheld test tool for DVB-T and DVB-H and WCDMA/HSPA/GSM area scanners/area testers for area coverage measurement.

 

Bit error tester runs from T1 to STM-1 rates

Stand-alone bit error tester provides unframed high speed PRBS, serial binary output ranging from T1 to STM-1 rates.

The Technisys PN 701182-1 bit error tester is a stand-alone device designed to provide unframed high speed PRBS, serial binary output ranging from T1 to STM-1 rates. Outputs can be encoded with applicable zero suppression techniques. Signal levels include differential and single ended AMI, CMI, ECL, PECL, RS422 and LVDS levels for copper interface and STM-1 (OC3) fibre optic interface.

All electrical I/O is through rear panel concentric twinaxial connectors or industry standard BNC connectors.

NRZ interfaces are all differential pairs.

Fibre optic l/O is through LC connectors and a SFP transceiver.

The SFP I/O can be electrical, if Infiniband or Fibre Channel device is installed.

The unit pricing for these is at under US $5000 with significant discount for quantity orders.

 

Handheld digital multimeters are hot products

Agilent's U1250A Series handheld digital multimeters have been named in EDN magazine's list of the Hot 100 Products.

Agilent's U1250A Series handheld digital multimeters have been named in EDN magazine's list of the Hot 100 Products of 2006. This list recognises the most innovative and significant new products built by and for electronics engineers in 2006. 'Agilent is honoured to receive this prestigious recognition from EDN', said Ee Huei Sin, Vice President and General Manager of Agilent's Basic Instruments Division.

'We view this as an acknowledgment of our commitment to provide engineers with affordable test-and-measurement solutions that deliver uncompromising measurement integrity'.

Designed for cost-sensitive engineers and technicians on the go, the U1250A Series includes two models that provide 4.5-digit resolution with +/-50,000 counts full-scale on a dual display.

Basic error limits are as low as 0.025%, enabling simultaneous, accurate measurements and providing the flexibility to perform both quick validation or tolerance checks and marginal-failure troubleshooting.

In addition to the basic measurement functions, the models come with capabilities such as automated data-logging with the optional PC interface cable, 20MHz frequency counter, and programmable square-wave generator and temperature measurement.

Enclosed in a robust package with shock-absorbing overmould, both models are Category III 1000V-rated and operate over a temperature range of -20 to +55C.

Tuesday, January 30, 2007

 

Handheld test set checks IPTV over VDSL2

Exfo Electro-Optical Engineering has developed the first handheld test set to support IPTV and HDTV over a standards-based VDSL2 test module.

Exfo Electro-Optical Engineering has developed the first handheld test set to support Internet Protocol television (IPTV) and high-definition television (HDTV) over a standards-based, very high-speed digital subscriber loop, version 2 (VDSL2) test module. This new product announcement marks the latest in a series of test modules for the CoLT-450P, a handheld, battery-powered test set for installation and maintenance applications on copper-based broadband access networks. VDSL2 is beginning to be deployed by network service providers (NSPs) as a part of their strategy to offer standard definition (SD), high-definition (HD) IPTV and IP video-on-demand (VOD) services over multiple channels.

NSPs use a fibre-to-the-node (FTTN) configuration to bring VDSL-based digital subscriber line access multiplexers (DSLAMs) within 900-1200m of subscribers.

This architecture enables VDSL2-based DSLAMs to deliver up to 100Mbit/s of downstream data to each subscriber with typical rates of 30Mbit/s.

As such, VDSL2 is regarded as an economical and rapid deployment alternative to fibre-to-the-home (FTTH).

Exfo's CoLT-450P, equipped with a new VDSL2 test module, allows NSP installation and maintenance personnel to confirm upstream/downstream connection rates, signal levels, VDSL2 error statistics and other important parameters of the VDSL2 link-up.

Once a link is established, technicians can use the CoLT-450P to test the various protocol layers and the quality of the applications themselves.

Exfo's solution interoperates with VDSL2 equipment that is based on several different chipsets.

In addition, it is backwards-compatible with some interim VDSL 1.5 solutions that exist in the field.

The CoLT-450P is used to install and troubleshoot digital subscriber line (DSL) circuits that deliver triple-play services (voice, data and video) over high-speed access networks.

The CoLT-450P is the first DSL test set to be purpose-built for assessing the high bit-rate throughput of multiple-channel HDTV.

This easy-to-use, modular test solution acts as a golden modem for confirming the rates and other measured parameters provided by asymmetric digital subscriber line (ADSL), ADSL2, ADSL2+, reach-extended (RE) ADSL and now VDSL2.

As well, the CoLT-450P performs functional testing and quality-of-service testing for voice-over-Internet Protocol (VoIP) and Internet services.

The CoLT-450P is an indispensable tool for rapid installation and efficient troubleshooting of IPTV services.

It supports an industry-leading and flexible suite for IPTV test capabilities.

The CoLT-450P features high-performance video-packet processing speed and throughput.

Once equipped with a CoLT-450P, technicians can establish a DSL connection, log onto a service provider's network: 'join' and 'leave' various streaming video channels, and measure the quality of the video stream.

The CoLT-450P has the power to support the highest DSL rates and performance, while simultaneously handling multiple standard and high-definition video streams.

A 10/100BaseT Ethernet interface enables the CoLT-450P to operate as a complete home/office DSL modem and router, allowing it to work 'in-line' on a live IPTV service in conjunction with a set-top box.

'With NSPs poised to make large-scale deployments of IPTV services, the CoLT-450P is an indispensable tool for rapid installation and efficient troubleshooting', said Robert Fitts, Exfo's Vice-President of Product Management, Copper Access Group.

'Launching this new VDSL2 test module barely a few weeks after receiving the 2006 Frost and Sullivan xDSL Growth Strategy Leadership Award proves that Exfo means business in the DSL and triple-play test space and is highly committed to deliver the best IPTV test solution on the market'.

 

Measurement products for aerospace testing

At Aerospace Testing Expo, Rohde and Schwarz will showcase a cross-section of its broad portfolio of test and measurement products.

At Aerospace Testing Expo (Munich, Germany, 27th to 29th March 2007), Rohde and Schwarz (Hall A1, Stand 1204) will showcase a cross-section of its broad portfolio of test and measurement products, ranging from high-end instruments for signal generation and analysis to network analysis and standards-compliant EMC measurements. Depending on customer requirements, the company offers complete system solutions or stand-alone applications. Plus, individual products can be integrated into existing systems.

To ensure flexible use, the instruments from Rohde and Schwarz are downward-compatible.

And features such as LXI compatibility provide the safety of investment demanded by customers.

In everyday operation, antenna and radar systems must often handle pulsed signals.

Amplifiers and on-wafer measurements also require pulsed signals in order to avoid overheating.

With the R and S ZVA-K7 software option, Rohde and Schwarz has integrated pulsed measurements into the R and S ZVA family of high-end network analysers, thus providing a compact and cost-efficient solution.

Absolute levels, complex S-parameters, and quantities derived from them can be displayed in real time by using pulses with a resolution of 12.5ns.

The option makes it possible to analyse periodic and nonperiodic pulses as well as single pulses with an IF bandwidth of up to 30MHz.

Special advantages of the new method include simple test setup and adaptive error correction when measurement settings are changed.

When equipped with the R and S SMA-K25 option, the analogue R and S SMA100A high-end signal generator operates as a source for precise VOR/ILS signals.

The instrument's low modulation errors and high level accuracy permit reliable tests on air navigation receivers.

With a frequency range of 9kHz to 6GHz, it can be used for all applications in the lab, in production, and in service that require signals of high spectral purity.

The compact R and S SMA100A generates amplitude modulation (AM) and pulse modulation signals as standard.

For mil/aero applications, the instrument can be upgraded with a high-end pulse generator by means of the R and S SMA-K23 option.

To enable users to check and maintain ILS and VOR systems, Rohde and Schwarz has developed the R and S EVS300.

This robust level and modulation analyser with a weight of less than 6kg is ideal for use not only in the laboratory but also at airports and for performing flight inspections with measurement aircraft.

An internal calibration generator enables it to achieve very high level measurement accuracy.

In addition to extremely fast measurement value processing, the R and S EVS300 features an internal data memory that records up to ten million measurement data records for applications with maximum measurement speed or for long-term monitoring.

The measurement values can be transmitted over standard interfaces or copied to a USB memory stick.

In the absence of an AC supply, rechargeable batteries provide an operating time of 8-10h during continuous measurements.

Rohde and Schwarz will also present the R and S SMF100A at Aerospace Testing Expo.

This new analogue microwave signal generator claims new standards in single sideband (SSB) phase noise.

Thanks to its unique value of -115dBc (at 10GHz/10kHz offset), the instrument is ideal for a variety of telecommunications and radar applications.

In addition, high output power and very short setting times enable flexible applications in production.

With level and frequency setting times of 4 and 3ms, respectively, the R and S SMF100A achieves an outstanding value.

Moreover, the instrument provides output power of typically up to +26dBm without an external amplifier.

The R and S SMF100A is designed for a frequency range up to 22GHz.

To develop and produce high-quality transmit and receive equipment such as communications systems and radar, users need the conventional measurements of both a phase noise tester and a spectrum analyser.

The R and S FSUP is the only instrument worldwide that combines a spectrum analyser and a phase noise tester up to 50GHz.

With the R and S FSUP, Rohde and Schwarz for the first time offers an instrument specially designed for characterising RF signal sources and in particular for measuring phase noise.

The R and S FSUP incorporates the company's many years of experience in developing high-quality spectrum analysers and low-noise oscillators and synthesisers.

The R and S FSUP allows extremely flexible and easy test setups and reduces investment costs significantly.

The R and S FSH18 handheld spectrum analyser from Rohde and Schwarz underscores the company's continued development of the 3 and 6GHz models of the R and S FSH, already firmly established on the market.

These models are highly regarded by users especially because of their extensive measurement functions, excellent RF characteristics, and compact design (2.5kg).

Accommodated in the same housing as the low-frequency models, the R and S FSH18 is ideal for a variety of applications in the microwave range.

In field use, this newcomer helps to detect spurious signals in a frequency range up to 18GHz - no matter whether in tests on radar equipment, air traffic control systems, satellite systems, or microwave links.

Plus, it covers the complete frequency range for WiMAX, thus providing a cost-effective solution for spectrum measurements in this field.

To enable users to perform complex measurements on radar and mobile radio signals, Rohde and Schwarz offers its R and S NRP-Z81 broadband power sensor.

For the first time, an RF detector, analogue and digital signal processing, as well as the entire evaluation logic of a peak power meter are combined in a compact sensor that can be directly remote-controlled via USB.

By featuring video bandwidth of up to 30MHz and a rise time of 13ns, the R and S NRP-Z81 allows high-resolution envelope analyses.

Complete statistical analysis of a signal can be performed within only a few milliseconds.

For average power measurements, it provides a dynamic range of 80dB.

The instrument's frequency range extends from 50MHz to 18GHz.

The R and S ESU from Rohde and Schwarz is a new family of CISPR16-1-1-compliant EMI test receivers that meets all civil and military standards for electromagnetic interference measurements.

A new, FFT-based test method considerably speeds up measurements.

The time-domain scan allows users to perform overview measurements more than 100 times faster than with existing EMI test receivers.

The instrument also features comprehensive test functions, a complete set of parallel detectors including the new CISPR-RMS detector, RF scan, IF analysis, and a flexible report layout function.

Thursday, January 25, 2007

 

Alcatel-Lucent adopts testers for IPTV

Alcatel-Lucent has chosen Agilent as a formal test and measurement partner for its IPTV ecosystem.

Alcatel-Lucent has chosen Agilent as a formal test and measurement (T and M) partner for its IPTV ecosystem. The partnership will enable collaboration to ensure that new IP-based video deployments meet end-to-end service-quality expectations. Agilent test solutions provide a holistic approach to measuring and monitoring video service quality from R and D and lab-based performance validation, through to service assurance and network troubleshooting.

Realising the critical role that T and M solutions play in the effective delivery of IP-based video services, Alcatel-Lucent has proactively established formal relationships with best-in-class vendors in the IPTV T and M segment.

Service providers and network equipment manufacturers face the challenge of converging new IP-based video services, such as IPTV and video on demand (VOD), with existing voice and data services to residential customers over a single access point.

Ensuring network integrity, quality of service (QoS) and subscriber quality of experience (QoE) is critical to the success of video service deployments.

Agilent offers a portfolio of solutions for testing video service quality, including research and development through to network installation and ongoing monitoring.

Agilent equipment provides stress testing and service validation prior to and during the installation process, which significantly reduces post-deployment performance issues and helps prepare new service offerings for production networks.

Agilent's monitoring tools provide real-time video-quality analysis and troubleshooting for live video service deployments, which is critical given the complexity and ever-changing conditions within next-generation triple play networks.

These test solutions help network equipment manufacturers and service providers reduce time to market, lower development costs and minimise risks for new IP-based service offerings.

Alcatel-Lucent's IPTV ecosystem includes the following Agilent equipment.

The Agilent N2X multiservices test solution provides predeployment verification of IPTV service quality under highly scaled and dynamic triple play network conditions.

The N2X emulates thousands of dynamic IPTV subscribers and generates triple play video, voice over IP and data (high-speed Internet) traffic to place significant stress on IPTV network equipment.

N2X delivers real-time MDI metrics, protocol decodes and post-capture replay for IPTV traffic.

The Agilent J6900A is triple play analyser, which provides complete analysis and troubleshooting in a single platform for installation, monitoring and troubleshooting of voice, data and video services.

The analyser provides accurate measurements of VoIP, IPTV and VoD Quality of Experience as well as real-time channel-zapping analysis.

The Agilent FrameScope Pro handheld instrument allows technicians to measure point-to-point network performance and to correlate triple play transport quality and QoS with end-user QoE.

Its network test toolbox provides insights into network impairments and helps locate failures and bottlenecks.

'Agilent equips network equipment manufacturers and service providers with the tools they need to measure video service quality at the most granular level', said Rod Unverrich, Business Manager of Agilent's Data Network Operation.

'Our video test solutions address all stages of the test cycle to improve both the time to market and performance of new video service deployments'.

 

Options expand range of digital comms analyser

Agilent Technologies has introduced industry-first phase noise application software and options for the DCA-J digital communications analyser.

Agilent Technologies has introduced industry-first phase noise application software and options for the digital communications analyser (DCA-J). The software allows phase noise/spectral jitter analysis of clock and data signals over a wide dynamic range from 50Mbit/s to 13.5Gbit/s. A new optical/electrical module provides optical transmitter test and 40Gbit/s optical compliance test; an advanced amplitude analysis option offers new methods for optical modulation amplitude and relative intensity noise.

These enhancements prove the DCA-J's leading-edge performance and capabilities as an affordable, comprehensive, easy-to-use sampling scope for optical and electrical applications.

The multirate wide loop bandwidth clock recovery module allows precision waveform measurements with a variety of signals, including spread spectrum clocked.

This is the industry's first phase noise application software, which allows phase noise/spectral jitter analysis of clock and data signals ranging from 50Mbit/s to 13.5Gbit/s.

Many serial bus architectures employ spread spectrum clocking for better signal integrity, known as electromagnetic interference (EMI) management.

Hardware clock recovery elements of sampling oscilloscopes have not been able to follow the large amounts of jitter produced with spread spectrum clocks, making meaningful measurements virtually impossible.

This has been overcome with the Agilent 83496B.

The 83496B and phase noise application software reveal root causes of jitter through frequency domain analysis - an effective and easy method for detecting jitter sources.

Also, this solution can perform the analysis on both clock and data signals, so the root causes of data jitter can be related to system clocks.

'This tool allows our customers to see the root causes of jitter, whereas other measurement tools are limited in dynamic range or in the types of signals they can observe', said Sigi Gross, Vice President and General Manager of Agilent's Digital Verifications Solutions Division.

In addition, the DCA-J offers three new functions for optical applications.

The 86116C can be used as a 65GHz oscilloscope channel or switched to a reference receiver for 40Gbit/s optical transmitter eye-mask test.

Carefully controlled frequency response allows operation as a reference receiver and provides consistent and accurate eye mask tests.

It can be configured at standard or FEC rates for OC-768, STM-256 and related specifications.

Just as the DCA-J revolutionised jitter analysis, DCA-J option 300 provides the same industry-accepted analysis now translated into the amplitude domain.

This enables capabilities such as relative intensity noise (RIN) measurement, a common specification for optical transmitters.

Historically, RIN measurements have required expensive or complicated test equipment.

Now, with this software, eye-mask tests and RIN measurements can be performed quickly and accurately using the same equipment and at the same time.

Option 300 also allows separation of interference parameters to extremely low probabilities, providing an accurate measurement of Q-factor, commonly used to estimate bit error ratio.

Agilent's new Rev 7.0 firmware for the 86100C DCA-J enhances the system through a novel approach to the measurement of optical modulation amplitude (OMA), a common specification for optical transmitters.

The general OMA test requires special data patterns.

Agilent's 86100C provides the correct OMA result for these patterns, and has the added flexibility to provide an accurate OMA result for virtually any data pattern.

This flexibility eliminates the need to reconfigure the stimulus, saving measurement time for a complete characterisation of the transceiver.

All products will be available from 1st February 2007.

The Agilent 83496B multirate wide bandwidth clock recovery module will start at US $18,500.

The 86116C optical/electrical module will start at $64,089.

The 86100C Option 300 amplitude interference/RIN/Q-factor software will cost $2800.

The Agilent 86100C Infiniium DCA-J firmware revision 7.0 will be available at no charge via the web.

Sunday, January 21, 2007

 

Modules expand optical transport network tests

Exfo Electro-Optical Engineering has added ODU1 to ODU2 multiplexing test capabilities on its Transport Blazer test modules.

Exfo Electro-Optical Engineering has evolved its optical transport network (OTN) test solution with the availability of ODU1 to ODU2 multiplexing test capabilities on its Transport Blazer test modules. As defined in the ITU-T G.709 (Optical Transport Network) standard, the Optical Channel Data Unit (ODU) multiplex/demultiplex scheme allows four ODU1 signals within one ODU2 signal structure. This scheme provides a cost-efficient means of transporting 2.5G dense-wavelength division multiplexed (DWDM) services onto 10.7G DWDM wavelengths.

Exfo's enhanced OTN test solution supports OTU1 (2.7Gbit/s) and OTU2 (10.7Gbit/s) test rates, as well as ODU1 to ODU2 multiplex/demultiplex schemes.

In addition, it covers forward error correction (FEC) generation/analysis, all OTN layer-alarm generation/monitoring, and trace-message generation/analysis.

This combined feature-set is offered as a Transport Blazer test module for the FTB-200 compact platform to produce the most portable and lightweight OTN solution in the industry.

It can also be hosted in the FTB-400 universal test system and IQS-500 intelligent test system for field deployment, maintenance, troubleshooting and lab applications.

'Exfo's Transport Blazer test solution continues to evolve as customer deployments and requirements become more well-defined, especially with regard to optimising DWDM networks', said Etienne Gagnon, Exfo's Vice-President of Protocol-Layer Product Management.

'OTN deployments are growing and increasingly becoming more important as reconfigurable optical add-drop multiplexers (ROADMs) gain acceptance'.

'As a result, the need for advanced OTN test capabilities is becoming more apparent and Exfo is once again at the forefront of the innovation curve with a comprehensive technology offering in a compact format'.

 

Simulator tests all NIBP monitors

Rigel Medical has upgraded its NIBP simulator for the fast and accurate testing of all types of NIBP monitors.

Rigel Medical has upgraded its NIBP simulator for the fast and accurate testing of all types of NIBP monitors. The new Rigel 311c is an advanced technology battery powered NIBP simulator, which now incorporates innovative calibration tables for all the major monitor manufacturers. The comprehensive CalTables have been developed and certified by the NIBP monitor manufacturers enabling test results to be immediately and automatically corrected and verified.

In addition, the CalTables can be upgraded quarterly in line with individual manufacturers' recommendations to ensure that the Rigel 311c is continually capable of testing within specifications.

The Rigel 311c is a lightweight and compact NIBP simulator that has been designed specifically for highly portable applications in biomedical engineering departments in hospitals, health centres and similar medical facilities.

The tester incorporates an internal pump for static calibration, leak tests and overpressure tests.

Built-in adult and neonate mandrels also eliminate the need for blocks to be used to test blood pressure monitors.

Other special features include independent systolic and diastolic pressures, high-resolution cuff and pulse pressure waveform display and closed-loop servo for accurate pulse generation.

The Rigel 311c forms part of a high performance range of specialist biomedical test equipment supplied by Rigel Medical, part of the Seaward Group.

This page is powered by Blogger. Isn't yours?