Thursday, January 04, 2007
Scope analyses next-generation serial streams
Digital serial analyser sampling oscilloscope, remote sampling electrical modules and enhanced IConnect software are ideal for serial data network analysis applications.
New from Tektronix, the DSA8200 digital serial analyser sampling oscilloscope, remote sampling electrical modules and enhanced IConnect software are ideal for serial data network analysis applications. The new TDR (time-domain-reflectometry) and electrical modules represent the most significant performance advancement in TDR test technology in 20 years, in direct response to the demanding needs and compliance requirements of high-speed serial data standards. The emergence of multigigabit serial standards is driving down power budgets and timing margins.
As a result, accurate analysis of signal path and interconnects in both time and frequency domains is critical to fully understand the effects of loss and crosstalk in today's high speed serial designs.
Industry standards such as PCI Express, Serial ATA, XAUI, and Infiniband increasingly call for the use of S-parameters and impedance measurements to characterise the effects and ensure system interoperability.
With a 250% increase in TDR performance and new automation tools, the new DSA8200 solutions are an ideal fit for serial data network analysis requirements.
The DSA8200 represents the highest performance and most cost-effective solution for accurate and repeatable S-parameters measurements for 1 to 12.5Gbit/s serial datarates of current and emerging differential standards.
'Engineers are challenged to accurately characterise the effects of the signal path on multi-gigabit serial data transmissions', said Brian Reich, General Manager, Electrical Optical Product Line, Tektronix.
'For serial data network analysis applications, the Tektronix DSA8200 solutions provide engineers with a versatile, time and cost-effective toolset'.
'The primary alternative has been the vector network analyser (VNA), a specialised, dedicated frequency-domain instrument'.
'However, the VNA requires extensive setup and calibration routines, and is significantly more expensive than the new Tektronix TDR-based solution'.
'TDR and S-parameter measurement routines for serial data network analysis that often require hours to set up and execute using a VNA can be performed in a few minutes using the DSA8200 mainframe, new electrical modules and IConnect'.
Four new electrical modules feature an unparalleled combination of high bandwidth and low noise to address the trend toward lower power, higher bit rate differential signalling.
The modules include advanced usability features such as channel-to-channel and module-to-module deskew of +/-250ps, user-selectable bandwidth, and small form factor remote samplers.
Each channel has a fully integrated 2m cable with a remote sampler that brings the TDR head very close to the device under test (DUT), minimising the effects of probes, cables, and fixtures.
This ensures the highest possible system fidelity for measurement accuracy and repeatability.
The 80E10 Dual Channel True Differential TDR module provides a 12ps incident and 15ps reflected TDR rise time, 50GHz bandwidth and 600uV RMS noise, the lowest noise at this performance level.
With independent step generation for true differential measurements and industry-leading specifications for a fully integrated system, the 80E10 represents the most significant advance in TDR performance in twenty years.
Other modules include the 80E08, a dual channel TDR electrical module with 18ps incident and 20ps reflected rise times, and 300uV RMS noise at 30GHz bandwidth.
Two new dual channel low-noise electrical modules, the 80E09 and 80E07, feature 450uV RMS noise at 60GHz and 300uV RMS noise at 30GHz, respectively.
IConnect software provides efficient and easy signal integrity analysis for gigabit serial data interconnect links.
IConnect quickly measures insertion and return losses, reflections, eye diagrams, jitter, crosstalk, reflections and ringing.
The IConnect product family has three product configurations: IConnect, IConnect S-parameters and IConnect with MeasureXtractor.
IConnect applications include signal path integrity analysis, impedance characterisation, S-parameters (insertion and return loss), eye diagram compliance tests and fault isolation.
A new command line interface (CLI) enables automation of multi-port S-parameter measurements, and other compliance test needs, significantly reducing calibration and test times while increasing test repeatability.
With automated CLI scripts, test routines typically requiring hours for set-up and execution can now be performed in a few minutes, greatly improving productivity.
IConnect now also supports very long record lengths with up to 1M points.
1M memory provides sufficient S-parameter frequency domain resolution and the highest frequency when measuring long devices such as cables.
A new EZ Z-Line viewer enables dynamic adjustment of the oscilloscope for much more efficient fault isolations in packages, PCBs and on-chip.
IConnect also supports Touchstone file export capabilities.
'Tektronix pioneered the TDR-based S-parameter measurements, and provides the most cost-efficient and highest-throughput approach to measurements in digital design, signal integrity analysis, and interconnect compliance testing', said Kiran Unni, Program Industry Manager, Test and Measurement group with Frost and Sullivan.
'As a new generation of S-parameter users become familiar with this measurement methodology they will look for an instrument solution that is familiar and provides accurate and repeatable results'.
'The DSA8200 is a versatile, cost and time effective solution to achieve accurate, repeatable S-parameter measurements for serial data network analysis applications in product development and manufacturing'.
The DSA8200 digital serial analyser is based on a new generation hardware mainframe designed for the communication, computer, and consumer electronics industries that increasingly require signal path characterisation and compliance verification.
The DSA8200 provides the versatility and superior accuracy needed for characterisation, design validation, and compliance verification of time and frequency domain behaviour of differential channel interconnects for high-speed serial standards including PCI-Express II, FB-DIMM II, SATA II, and 10Gbit/s Ethernet.
The DSA8200 extends the capabilities of the TDS/CSA8200 Series and provides full support for the same modules and software.
The new mainframe unit incorporates a high-speed processor and the benefits and familiarity of the Microsoft Windows XP operating system.
The new front panel mounted DVD/CD-RW combo drive and USB 2.0 port provides easier and faster measurement and data file storage and transfer.
With six available mainframe slots, the DSA8200 provides the most extensible modular architecture, allowing users to configure the instrument to meet their most demanding measurement challenges today and in the future.
The DSA8200 can be configured for up to four true differential TDR channels, the most available in any oscilloscope-based toolset for serial data network analysis.
When combined with the new TDR modules and IConnect capabilities, the new DSA8200 solution provides the most complete and cost-effective solution for the analysis and characterisation of complex serial data networks.
New from Tektronix, the DSA8200 digital serial analyser sampling oscilloscope, remote sampling electrical modules and enhanced IConnect software are ideal for serial data network analysis applications. The new TDR (time-domain-reflectometry) and electrical modules represent the most significant performance advancement in TDR test technology in 20 years, in direct response to the demanding needs and compliance requirements of high-speed serial data standards. The emergence of multigigabit serial standards is driving down power budgets and timing margins.
As a result, accurate analysis of signal path and interconnects in both time and frequency domains is critical to fully understand the effects of loss and crosstalk in today's high speed serial designs.
Industry standards such as PCI Express, Serial ATA, XAUI, and Infiniband increasingly call for the use of S-parameters and impedance measurements to characterise the effects and ensure system interoperability.
With a 250% increase in TDR performance and new automation tools, the new DSA8200 solutions are an ideal fit for serial data network analysis requirements.
The DSA8200 represents the highest performance and most cost-effective solution for accurate and repeatable S-parameters measurements for 1 to 12.5Gbit/s serial datarates of current and emerging differential standards.
'Engineers are challenged to accurately characterise the effects of the signal path on multi-gigabit serial data transmissions', said Brian Reich, General Manager, Electrical Optical Product Line, Tektronix.
'For serial data network analysis applications, the Tektronix DSA8200 solutions provide engineers with a versatile, time and cost-effective toolset'.
'The primary alternative has been the vector network analyser (VNA), a specialised, dedicated frequency-domain instrument'.
'However, the VNA requires extensive setup and calibration routines, and is significantly more expensive than the new Tektronix TDR-based solution'.
'TDR and S-parameter measurement routines for serial data network analysis that often require hours to set up and execute using a VNA can be performed in a few minutes using the DSA8200 mainframe, new electrical modules and IConnect'.
Four new electrical modules feature an unparalleled combination of high bandwidth and low noise to address the trend toward lower power, higher bit rate differential signalling.
The modules include advanced usability features such as channel-to-channel and module-to-module deskew of +/-250ps, user-selectable bandwidth, and small form factor remote samplers.
Each channel has a fully integrated 2m cable with a remote sampler that brings the TDR head very close to the device under test (DUT), minimising the effects of probes, cables, and fixtures.
This ensures the highest possible system fidelity for measurement accuracy and repeatability.
The 80E10 Dual Channel True Differential TDR module provides a 12ps incident and 15ps reflected TDR rise time, 50GHz bandwidth and 600uV RMS noise, the lowest noise at this performance level.
With independent step generation for true differential measurements and industry-leading specifications for a fully integrated system, the 80E10 represents the most significant advance in TDR performance in twenty years.
Other modules include the 80E08, a dual channel TDR electrical module with 18ps incident and 20ps reflected rise times, and 300uV RMS noise at 30GHz bandwidth.
Two new dual channel low-noise electrical modules, the 80E09 and 80E07, feature 450uV RMS noise at 60GHz and 300uV RMS noise at 30GHz, respectively.
IConnect software provides efficient and easy signal integrity analysis for gigabit serial data interconnect links.
IConnect quickly measures insertion and return losses, reflections, eye diagrams, jitter, crosstalk, reflections and ringing.
The IConnect product family has three product configurations: IConnect, IConnect S-parameters and IConnect with MeasureXtractor.
IConnect applications include signal path integrity analysis, impedance characterisation, S-parameters (insertion and return loss), eye diagram compliance tests and fault isolation.
A new command line interface (CLI) enables automation of multi-port S-parameter measurements, and other compliance test needs, significantly reducing calibration and test times while increasing test repeatability.
With automated CLI scripts, test routines typically requiring hours for set-up and execution can now be performed in a few minutes, greatly improving productivity.
IConnect now also supports very long record lengths with up to 1M points.
1M memory provides sufficient S-parameter frequency domain resolution and the highest frequency when measuring long devices such as cables.
A new EZ Z-Line viewer enables dynamic adjustment of the oscilloscope for much more efficient fault isolations in packages, PCBs and on-chip.
IConnect also supports Touchstone file export capabilities.
'Tektronix pioneered the TDR-based S-parameter measurements, and provides the most cost-efficient and highest-throughput approach to measurements in digital design, signal integrity analysis, and interconnect compliance testing', said Kiran Unni, Program Industry Manager, Test and Measurement group with Frost and Sullivan.
'As a new generation of S-parameter users become familiar with this measurement methodology they will look for an instrument solution that is familiar and provides accurate and repeatable results'.
'The DSA8200 is a versatile, cost and time effective solution to achieve accurate, repeatable S-parameter measurements for serial data network analysis applications in product development and manufacturing'.
The DSA8200 digital serial analyser is based on a new generation hardware mainframe designed for the communication, computer, and consumer electronics industries that increasingly require signal path characterisation and compliance verification.
The DSA8200 provides the versatility and superior accuracy needed for characterisation, design validation, and compliance verification of time and frequency domain behaviour of differential channel interconnects for high-speed serial standards including PCI-Express II, FB-DIMM II, SATA II, and 10Gbit/s Ethernet.
The DSA8200 extends the capabilities of the TDS/CSA8200 Series and provides full support for the same modules and software.
The new mainframe unit incorporates a high-speed processor and the benefits and familiarity of the Microsoft Windows XP operating system.
The new front panel mounted DVD/CD-RW combo drive and USB 2.0 port provides easier and faster measurement and data file storage and transfer.
With six available mainframe slots, the DSA8200 provides the most extensible modular architecture, allowing users to configure the instrument to meet their most demanding measurement challenges today and in the future.
The DSA8200 can be configured for up to four true differential TDR channels, the most available in any oscilloscope-based toolset for serial data network analysis.
When combined with the new TDR modules and IConnect capabilities, the new DSA8200 solution provides the most complete and cost-effective solution for the analysis and characterisation of complex serial data networks.
# posted by Swathi @ 8:29 PM 
